参数资料
型号: MCP4725A1T-E/CH
厂商: Microchip Technology
文件页数: 24/50页
文件大小: 0K
描述: IC DAC 12BIT EE W/I2C SOT23-6
标准包装: 1
设置时间: 6µs
位数: 12
数据接口: EEPROM,I²C,串行
转换器数目: 1
电压电源: 单电源
工作温度: -40°C ~ 125°C
安装类型: 表面贴装
封装/外壳: SOT-23-6
供应商设备封装: SOT-23-6
包装: 标准包装
输出数目和类型: 1 电压,单极;1 电压,双极
采样率(每秒): *
产品目录页面: 673 (CN2011-ZH PDF)
配用: MCP4725DM-PTPLS-ND - BOARD DAUGHTER PICTAIL MCP4725
其它名称: MCP4725A1T-E/CHDKR
MCP4725
DS22039D-page 30
2009 Microchip Technology Inc.
TABLE 7-1:
I2C SERIAL TIMING SPECIFICATIONS
Electrical Specifications: Unless otherwise specified, all limits are specified for TA = -40 to +85°C, VDD = +2.7V to +5.0V, VSS = 0V.
Parameters
Sym
Min
Typ
Max
Units
Conditions
Standard Mode
Clock frequency
fSCL
0
100
kHz
Clock high time
THIGH
4000
ns
Clock low time
TLOW
4700
ns
SDA and SCL rise time
TR
1000
ns
From VIL to VIH (Note 1)
SDA and SCL fall time
TF
300
ns
From VIH to VIL (Note 1)
START condition hold time
THD:STA
4000
ns
After this period, the first clock
pulse is generated.
(Repeated) START condition
setup time
TSU:STA
4700
ns
Data hold time
THD:DAT
0
3450
ns
Data input setup time
TSU:DAT
250
ns
STOP condition setup time
TSU:STO
4000
ns
Output valid from clock
TAA
0
3750
ns
Notes 2 and 3
Bus free time
TBUF
4700
ns
Time between START and STOP
conditions.
Fast Mode
Clock frequency
TSCL
0
400
kHz
Clock high time
THIGH
600
ns
Clock low time
TLOW
1300
ns
SDA and SCL rise time
TR
20 + 0.1Cb
300
ns
From VIL to VIH (Note 1)
SDA and SCL fall time
TF
20 + 0.1Cb
300
ns
From VIH to VIL (Note 1)
START condition hold time
THD:STA
600
ns
After this period, the first clock
pulse is generated
(Repeated) START condition
setup time
TSU:STA
600
ns
Data hold time
THD:DAT
0
900
ns
Data input setup time
TSU:DAT
100
ns
STOP condition setup time
TSU:STO
600
ns
Output valid from clock
TAA
0
1200
ns
Notes 2 and 3
Bus free time
TBUF
1300
ns
Time between START and STOP
conditions.
Note 1:
This parameter is ensured by characterization and not 100% tested.
2:
This specification is not a part of the I2C specification. This specification is equivalent to the Data Hold Time (THD:DAT)
plus SDA Fall (or rise) time: TAA = THD:DAT + TF (OR TR).
3:
If this parameter is too short, it can create an unintended START or STOP condition to other devices on the same bus
line. If this parameter is too long, Clock Low time (TLOW) can be affected.
4:
For Data Input: This parameter must be longer than tSP. If this parameter is too long, the Data Input Setup (TSU:DAT) or
Clock Low time (TLOW) can be affected.
For Data Output: This parameter is characterized, and tested indirectly by testing TAA parameter.
5:
All timing parameters in high-speed modes are tested at VDD = 5V.
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