参数资料
型号: MCZ33291LEG
厂商: Freescale Semiconductor
文件页数: 9/26页
文件大小: 0K
描述: IC SWITCH 8X LOSIDE W/SPI 24SOIC
标准包装: 30
类型: 低端
输入类型: SPI
输出数: 8
导通状态电阻: 1.1 欧姆
电流 - 输出 / 通道: 500mA
电流 - 峰值输出: 3A
电源电压: 9 V ~ 26.5 V
工作温度: -40°C ~ 125°C
安装类型: 表面贴装
封装/外壳: 24-SOIC(0.295",7.50mm 宽)
供应商设备封装: 24-SOIC W
包装: 管件
ELECTRICAL CHARACTERISTICS
ELECTRICAL PERFORMANCE CURVES
ELECTRICAL PERFORMANCE CURVES
t R(SI)
t F(SI)
V DD = 5.0 V
0.7 V DD
< 50 ns
50%
< 50 ns
5.0 V
SCLK
0.2 V DD
0
33291L
t DLY(LH)
0.7 V DD
V OH
SCLK
Under
Test
SO
C L = 200 pF
SO
(Low-to-High)
SO
(High-to-Low)
0.2 V DD
t VALID
0.7 V DD
t R(SO)
t F(SO)
V OL
V OH
t DLY(HL)
0.2 V DD
V OL
C L represents the total capacitance of the test fixture and probe.
Figure 4. Valid Data Delay Time and
Valid Time Test Circuit
SO (Low-to-High) is for an output with internal conditions such that
the low-to-high transition of CS causes the SO output to switch from
high to low.
Figure 6. Valid Data Delay Time and
Valid Time Waveforms
t R(SI)
t F(SI)
V DD = 5.0 V
V Pull-Up = 2.5 V
CS
0.2 VDD
< 50 ns
90%
10%
< 50 ns
0.7 VDD
5.0 V
0
R L = 1.0 k Ω
SO
tSO(EN)
tSO(DIS)
VTri-State
CS
33291L
Under
Test
SO
(High-to-Low)
90%
10%
tSO(dis
C L = 20 pF
tSO(EN)
90%
tSO(DIS)
VOH
SO
(Low-to-High)
10%
VTri-State
1. SO (high-to-low) waveform is for SO output with internal conditions such
C L represents the total capacitance of the test fixture and probe.
Figure 5. Enable and Disable Time Test Circuit
that SO output is low except when an output is disabled as a result of de-
tecting a circuit fault with CS in a High Logic state; e.g., open load.
2. SO (low-to-high) waveform is for SO output with internal conditions such
that SO output is high except when an output is disabled as a result of de-
tecting a circuit fault with CS in a High Logic state; e.g., shortened load.
Figure 7. Enable and Disable Time Waveforms
33291L
Analog Integrated Circuit Device Data
Freescale Semiconductor
9
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