参数资料
型号: MPC5553EVBISYS
厂商: Freescale Semiconductor
文件页数: 40/68页
文件大小: 0K
描述: KIT EVAL ISYSTEMS MPC5553
标准包装: 1
类型: 微控制器
适用于相关产品: MPC5553
所含物品: 评估板和演示软件
相关产品: MPC5553MZQ132-ND - IC MCU MPC5553 REV A 324-PBGA
MPC5553MZP132-ND - IC MCU MPC5553 REV A 416-PBGA
Electrical Characteristics
MPC5553 Microcontroller Data Sheet, Rev. 4
Freescale Semiconductor
45
3.13.9
eQADC SSI Timing
Figure 27. EQADC SSI Timing
Table 27. EQADC SSI Timing Characteristics
Spec
Rating
Symbol
Minimum
Typical
Maximum
Unit
2
FCK period (tFCK = 1 fFCK)
1, 2
1 SS timing specified at V
DDEH = 3.0–5.25 V, TA = TL to TH, and CL = 25 pF with SRC = 0b11. Maximum operating frequency
varies depending on track delays, master pad delays, and slave pad delays.
2 FCK duty cycle is not 50% when it is generated through the division of the system clock by an odd number.
tFCK
2—
17
tSYS_CLK
3
Clock (FCK) high time
tFCKHT
tSYS_CLK 6.5
9
(t
SYS_CLK 6.5)
ns
4
Clock (FCK) low time
tFCKLT
tSYS_CLK 6.5
8
(t
SYS_CLK 6.5)
ns
5
SDS lead / lag time
tSDS_LL
–7.5
+7.5
ns
6
SDO lead / lag time
tSDO_LL
–7.5
+7.5
ns
7
EQADC data setup time (inputs)
tEQ_SU
22
ns
8
EQADC data hold time (inputs)
tEQ_HO
1—
ns
1st (MSB)
2nd
25th
26th
1st (MSB) 2nd
25th
26th
8
7
5
6
4
5
4
2
3
FCK
SDS
SDO
External device data sample at
SDI
EQADC data sample at
FCK falling-edge
FCK rising-edge
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