参数资料
型号: MT46V32M4TG-8L
厂商: Micron Technology, Inc.
英文描述: DOUBLE DATA RATE DDR SDRAM
中文描述: 双倍数据速率的DDR SDRAM内存
文件页数: 53/68页
文件大小: 2547K
代理商: MT46V32M4TG-8L
53
128Mb: x4, x8, x16 DDR SDRAM
128Mx4x8x16DDR_C.p65
Rev. C; Pub. 4/01
Micron Technology, Inc., reserves the right to change products or specifications without notice.
2001, Micron Technology, Inc.
128Mb: x4, x8, x16
DDR SDRAM
PRELIMINARY
39. The voltage levels used are derived from a
minimum V
DD
level and the referenced test load.
In practice, the voltage levels obtained from a
properly terminated bus will provide signifi-
cantly different voltage values.
40.
VIH overshoot: VIH(MAX) = V
DD
Q+1.5V for a
pulse width
3ns and the pulse width can not
be greater than 1/3 of the cycle rate. VIL
undershoot: VIL(MIN) = -1.5V for a pulse width
3ns and the pulse width can not be greater than
1/3 of the cycle rate.
41. V
DD
and V
DDQ
must track each other.
42.
This maximum value is derived from the
referenced test load. In practice, the values
obtained in a typical terminated design may
reflect up to 310ps less for
t
HZ(MAX) and the
last DVW.
t
HZ(MAX) will prevail over
t
DQSCK(MAX) +
t
RPST(MAX) condition.
t
LZ(MIN) will prevail over
t
DQSCK(MIN) +
t
RPRE(MAX) condition.
43.
For slew rates greater than 1V/ns the (LZ)
transition will start about 310ps earlier.
44. During initialization, V
DDQ
,
V
TT
,
and V
REF
must
be equal to or less than V
DD
+ 0.3V.
Alterna-
tively, V
TT
may be 1.35V maximum during power
up, even if V
DD
/V
DDQ
are 0 volts,
provided a
minimum of 42 ohms of series resistance is used
between the V
TT
supply and the input pin.
Figure D
Pull-Up Characteristics
-120
-100
-80
-60
-40
-20
0
0.0
0.5
1.0
1.5
2.0
2.5
V
DD
Q - V
OUT
(V)
I
O
Figure C
Pull-Down Characteristics
0
10
20
30
40
50
60
70
80
0.0
0.5
1.0
1.5
2.0
2.5
V
OUT
(V)
I
O
NOTES (continued)
45. The current Micron part operates below the
slowest JEDEC operating frequency of 83 MHz.
As such, future die may not reflect this option.
46.
t
RAP
t
RCD.
47. For the -75 and -75Z, I
DD
3N is specified to be
35mA at 100 MHz.
48. Random addressing changing 50% of data
changing at every transfer.
49. Random addressing changing 100% of data
changing at every transfer.
50. CKE must be active (high) during the entire time
a refresh command is executed. That is, from
the time the AUTO REFRESH command is
registered, CKE must be active at each rising clock
edge, until
t
REF later.
51. IDD2N specifies the DQ, DQS, and DM to be
driven to a valid high or low logic level. IDD2Q
is similar to IDD2F except IDD2Q specifies the
address and control inputs to remain stable.
Although IDD2F, IDD2N, and IDD2Q are
similar, IDD2F is
worst case.
52. Whenever the operating frequency is altered, not
including jitter, the DLL is required to be reset.
This is followed by 200 clock cycles.
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