参数资料
型号: NCP1034DR2G
厂商: ON Semiconductor
文件页数: 6/23页
文件大小: 0K
描述: IC REG CTRLR BUCK PWM VM 16-SOIC
标准包装: 1
PWM 型: 电压模式
输出数: 1
频率 - 最大: 500kHz
占空比: 80%
电源电压: 10 V ~ 18 V
降压:
升压:
回扫:
反相:
倍增器:
除法器:
Cuk:
隔离:
工作温度: -40°C ~ 125°C
封装/外壳: 16-SOIC(0.154",3.90mm 宽)
包装: 标准包装
产品目录页面: 1118 (CN2011-ZH PDF)
其它名称: NCP1034DR2GOSDKR
NCP1034
ELECTRICAL CHARACTERISTICS (Unless otherwise specified, these specifications apply over V CC = 12 V,
DRVV CC = V B = 12 V, ? 40 ° C < TJ < 125 ° C)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
ERROR AMPLIFIER
Source/Sink Current
Bandwidth
DC gain
I (Source/Sink)
(Note 3)
(Note 3)
50
4.0
100
10
55
120
m A
MHz
dB
Transconductance
g m
(Note 3)
1500
3150
4000
m mho
SOFT ? START/SD
Soft ? Start Current
Shutdown Output Threshold
I SS
S D
S S = 0 V
15
20
0.3
25
0.4
m A
V
OVERCURRENT PROTECTION
OCSET Voltage
V OCSET
1.25
V
Hiccup Current
Hiccup Duty Cycle
I Hiccup
Hiccup (duty)
(Note 3)
I Hiccup /I SS , (Note 3)
1.0
5.0
m A
%
OUTPUT DRIVERS
LO, Drive Rise Time
HI Drive Rise Time
LO Drive Fall Time
HI Drive Fall Time
t r (Lo)
t r (Hi)
t f (Lo)
t f (Hi)
C L = 1.5 nF (See Figure 3)
C L = 1.5 nF (See Figure 3)
C L = 1.5 nF (See Figure 3)
C L = 1.5 nF (See Figure 3)
17
17
10
10
ns
ns
ns
ns
Dead Band Time
LO Output High Short Circuit
Pulsed Current
HI Output High Short Circuit
Pulsed Current
LO Output Low Short Circuit
Pulsed Current
HI Output Low Short Circuit
Pulsed Current
LO Output Resistor, Source
LO Output Resistor, Sink
HI Output Resistor, Source
HI Output Resistor, Sink
t dead
t LDRVhigh
t HDRVhigh
t LDRVhigh
t HDRVhigh
R LOH
R LOL
R HIH
R HIL
(See Figure 3)
V LDRV = 0 V, P W v 10 m s,
T J = 25 ° C (Note 3)
V HDRV = 0 V, P W v 10 m s,
T J = 25 ° C (Note 3)
V LDRV = DRVV CC , P W v 10 m s,
T J = 25 ° C (Note 3)
V HDRV = V B , P W v 10 m s,
T J = 25 ° C (Note 3)
Typical Value @ 25 ° C, (Note 3)
Typical Value @ 25 ° C, (Note 3)
Typical Value @ 25 ° C, (Note 3)
Typical Value @ 25 ° C, (Note 3)
30
60
1.4
2.2
1.4
2.2
7
2
7
2
120
12
8
12
8
ns
A
A
A
A
W
W
W
W
2. Cold temperature performance is guaranteed via correlation using statistical quality control. Not tested in production.
3. Guaranteed by design but not tested in production.
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