参数资料
型号: NCV8612BMNR2G
厂商: ON Semiconductor
文件页数: 4/26页
文件大小: 0K
描述: IC REG LDO 5V/3.3V/ADJ 20DFN
标准包装: 2,500
稳压器拓扑结构: 正,固定式和可调式
输出电压: 5V,3.3V,可调式
输入电压: 7 V ~ 18 V
稳压器数量: 3
电流 - 输出: 120mA,80mA,400mA
电流 - 限制(最小): 180mA,120mA,500mA
工作温度: -40°C ~ 150°C
安装类型: 表面贴装
封装/外壳: 20-VFDFN 裸露焊盘
供应商设备封装: 20-QFN(6x5)
包装: 带卷 (TR)
NCV8612B
MAXIMUM RATINGS (Voltages are with respects to GND unless noted otherwise)
Rating
Maximum DC Voltage
Peak Transient
Maximum DC Voltage
Maximum DC Voltage
Maximum DC Voltage
Symbol
VIN ? B, VIN ? A, ASO_RAIL,
VBATT_MON, VIN_S3, EN, IGNIN
VIN ? B, VIN ? A, ASO_RAIL,
VBATT_MON, VIN_S3, EN, IGNIN
VIN ? H
IGNOUT, V PP , HV_DET, BO_DET,
HOT_FLG, RST, DLY, V OUT1 , V OUT2
V OUT3
Max
40
45
24
7
10
Min
? 0.3
? 0.3
? 0.3
? 0.3
? 0.3
Unit
V
V
V
V
V
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
THERMAL INFORMATION
Rating
Thermal Characteristic (Note 1)
Operating Junction Temperature Range
Maximum Storage Temperature Range
Moisture Sensitivity Level
Symbol
R q JA
T J
T STG
MSL
Min
40
? 40 to 150
? 55 to +150
1
Unit
° C/W
° C
° C
1. Values based on measurement of NCV8612B assembled on 2 ? layer 1 ? oz Cu thickness PCB with Copper Area of more than 645 mm 2 with
several thermal vias for improved thermal performance. Refer to CIRCUIT DESCRIPTION section for safe operating area.
ATTRIBUTES
Rating
ESD Capability, Human Body Model (Note 2)
ESD Capability, Machine Model (Note 2)
ESD Capability, Charged Device Model (Note 2)
IGNIN ESD Capability, Human Body Model (Note 2)
IGNIN ESD Capability, Machine Model (Note 2)
IGNIN ESD Capability (Note 3)
Symbol
ESD HB
ESD MM
ESD CDM
ESD HB _IGNIN
ESD MM _IGNIN
ESD_IGNIN
Min
2
200
1
3
200
10
Unit
kV
V
kV
kV
V
kV
2. This device series incorporates ESD protection and is tested by the following methods:
ESD Human Body Model (HBM) tested per AEC ? Q100 ? 002 (EIA/JESD22 ? A114)
ESD Machine Model (MM) tested per AEC ? Q100 ? 003 (EIA/JESD22 ? A115)
ESD Charged Device Model (CDM) tested per EIA/JES D22/C101, Field Induced Charge Model
3. Device tested with external 10 k W series resistance and 1 nF storage capacitor.
http://onsemi.com
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