参数资料
型号: NTD25P03L1
厂商: ON Semiconductor
文件页数: 1/9页
文件大小: 0K
描述: MOSFET P-CH 30V 25A IPAK
产品变化通告: Product Discontinuation 20/Aug/2008
标准包装: 75
FET 型: MOSFET P 通道,金属氧化物
FET 特点: 逻辑电平门
漏极至源极电压(Vdss): 30V
电流 - 连续漏极(Id) @ 25° C: 25A
开态Rds(最大)@ Id, Vgs @ 25° C: 80 毫欧 @ 25A,5V
Id 时的 Vgs(th)(最大): 2V @ 250µA
闸电荷(Qg) @ Vgs: 20nC @ 5V
输入电容 (Ciss) @ Vds: 1260pF @ 25V
功率 - 最大: 75W
安装类型: 通孔
封装/外壳: TO-251-3 短引线,IPak,TO-251AA
供应商设备封装: I-Pak
包装: 管件
其它名称: NTD25P03L1OS
NTD25P03L, STD25P03L
Power MOSFET
? 25 Amp, ? 30 Volt
Logic Level P ? Channel DPAK
Designed for low voltage, high speed switching applications and to
withstand high energy in the avalanche and commutation modes. The
http://onsemi.com
source ? to ? drain diode recovery time is comparable to a discrete fast
recovery diode.
Features
? S Prefix for Automotive and Other Applications Requiring Unique
Site and Control Change Requirements; AEC ? Q101 Qualified and
PPAP Capable
?
These Devices are Pb ? Free and are RoHS Compliant
V (BR)DSS
? 30 V
R DS(on) Typ
51 m W @ 5.0 V
P ? Channel
D
I D Max
? 25 A
Typical Applications
? PWM Motor Controls
? Power Supplies
? Converters
? Bridge Circuits
G
S
MARKING DIAGRAMS
& PIN ASSIGNMENTS
MAXIMUM RATINGS (T J = 25 ° C unless otherwise noted)
Rating Symbol
Value
Unit
4
Drain
Drain ? to ? Source Voltage
Gate ? to ? Source Voltage
? Continuous
? Non ? Repetitive (tp ≤ 10 ms)
Drain Current
? Continuous @ T A = 25 ° C
? Single Pulse (t p ≤ 10 m s)
V DSS
V GS
V GSM
I D
I DM
? 30
" 15
" 20
? 25
? 75
V
V
Vpk
A
Apk
1 2
3
4
DPAK
CASE 369C
STYLE 2
1
Gate
2
Drain
3
Source
Total Power Dissipation @ T A = 25 ° C
P D
75
W
Operating and Storage Temperature Range
T J , T stg
? 55 to
+150
° C
4
4
Drain
Single Pulse Drain ? to ? Source Avalanche
Energy ? Starting T J = 25 ° C
(V DD = 25 Vdc, V GS = 5.0 Vdc,
Peak I L = 20 Apk, L = 1.0 mH, R G = 25 W )
Thermal Resistance
? Junction ? to ? Case
? Junction ? to ? Ambient (Note 1)
? Junction ? to ? Ambient (Note 2)
Maximum Lead Temperature for Soldering
Purposes, (1/8 in from case for 10 seconds)
E AS
R q JC
R q JA
R q JA
T L
200
1.65
67
120
260
mJ
° C/W
° C
1
2
3
DPAK ? 3
CASE 369D
STYLE 2
1 2 3
Gate Drain Source
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. When surface mounted to an FR4 board using 0.5 sq in pad size.
2. When surface mounted to an FR4 board using the minimum recommended
pad size.
Y = Year
WW = Work Week
25P03L = Device Code
G = Pb ? Free Package
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 7 of this data sheet.
? Semiconductor Components Industries, LLC, 2011
October, 2011 ? Rev. 4
1
Publication Order Number:
NTD25P03L/D
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