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| 型号： | OM11078 |
| 厂商： | NXP Semiconductors |
| 文件页数： | 51/57页 |
| 文件大小： | 0K |
| 描述： | KIT LCD TOUCH 5.7" FOR LPC3250 |
| 标准包装： | 1 |
| 传感器类型： | 触摸屏幕 |
| 电源电压： | 5V |
| 嵌入式： | 是，MCU，16/32 位 |
| 已供物品： | 主板，LPC3250 板，LCD 触摸屏板，线缆，CD，调试器，电源 |
| 已用 IC / 零件： | LPC3250 ARM9 |
| 配用： | 568-4744-ND - MODULE DIMM LPC3250 ARM9 568-4742-ND - MODULE DIMM LPC2478 ARM7 |
| 相关产品： | 568-4533-ND - IC ARM9 MCU 256K 296-TFBGA |
| 其它名称： | 568-4743 |
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LPC3220_30_40_50
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2011. All rights reserved.
Product data sheet
Rev. 2 — 20 October 2011
55 of 79
NXP Semiconductors
LPC3220/30/40/50
16/32-bit ARM microcontrollers
10.5 ADC static characteristics
[1]
Conditions: VSSA = 0 V (on pin VSS_AD); VDDA(3V3) = 3.3 V (on pin VDD_AD).
[2]
The ADC is monotonic; there are no missing codes.
[3]
The differential linearity error (ED) is the difference between the actual step width and the ideal step width. See Figure 6.
[4]
The integral non-linearity (EL(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after
appropriate adjustment of gain and offset errors. See Figure 6.
[5]
The offset error (EO) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the
ideal curve. See Figure 6.
[6]
The gain error (EG) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset
error, and the straight line which fits the ideal transfer curve. See Figure 6.
[7]
The absolute error (ET) is the maximum difference between the center of the steps of the actual transfer curve of the non-calibrated
ADC and the ideal transfer curve. See Figure 6.
Table 10.
ADC static characteristics
VDDA(3V3) =3.3 V; Tamb =25C unless otherwise specified; ADC clock frequency 4.5 MHz.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VIA
analog input voltage
0
-
VDDA(3V3)
V
Cia
analog input capacitance
-
1
pF
ED
differential linearity error
0.5
1LSB
EL(adj)
integral non-linearity
[1][4] -
0.6
1LSB
EO
offset error
[1][5] -
1
3LSB
EG
gain error
[1][6] -
0.3
0.6
%
ET
absolute error
[1][7] -
4LSB
Rvsi
voltage source interface resistance
-
40
k
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| OM11078,598 | 功能描述:开发板和工具包 - ARM NXP LPC3250 IRD2.0-5.7"LCD/Lnx RoHS:否 制造商:Arduino 产品:Development Boards 工具用于评估:ATSAM3X8EA-AU 核心:ARM Cortex M3 接口类型:DAC, ICSP, JTAG, UART, USB 工作电源电压:3.3 V |
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| OM11079,598 | 功能描述:开发板和工具包 - ARM NXP LPC3250 SODIMM for IRD2.0 RoHS:否 制造商:Arduino 产品:Development Boards 工具用于评估:ATSAM3X8EA-AU 核心:ARM Cortex M3 接口类型:DAC, ICSP, JTAG, UART, USB 工作电源电压:3.3 V |
| OM11080,598 | 制造商:NXP Semiconductors 功能描述:LPC1768 CORTEX-M3 3.2" 2X40 LCD DISPLAY KIT, ARM CORTEX-M3 M - Boxed Product (Development Kits) |
| OM11082,598 | 功能描述:开发板和工具包 - ARM NXP LPC3250 IRD2.0-5.7"LCD/Lnx RoHS:否 制造商:Arduino 产品:Development Boards 工具用于评估:ATSAM3X8EA-AU 核心:ARM Cortex M3 接口类型:DAC, ICSP, JTAG, UART, USB 工作电源电压:3.3 V |
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