参数资料
型号: SI7461DP-T1-GE3
厂商: Vishay Siliconix
文件页数: 2/8页
文件大小: 0K
描述: MOSFET P-CH 60V 8.6A PPAK 8SOIC
产品目录绘图: DP-T1-(G)E3 Series 8-SOIC
标准包装: 1
FET 型: MOSFET P 通道,金属氧化物
FET 特点: 逻辑电平门
漏极至源极电压(Vdss): 60V
电流 - 连续漏极(Id) @ 25° C: 8.6A
开态Rds(最大)@ Id, Vgs @ 25° C: 14.5 毫欧 @ 14.4A,10V
Id 时的 Vgs(th)(最大): 3V @ 250µA
闸电荷(Qg) @ Vgs: 190nC @ 10V
功率 - 最大: 1.9W
安装类型: 表面贴装
封装/外壳: PowerPAK? SO-8
供应商设备封装: PowerPAK? SO-8
包装: 标准包装
产品目录页面: 1665 (CN2011-ZH PDF)
其它名称: SI7461DP-T1-GE3DKR
Si7461DP
www.vishay.com
SPECIFICATIONS (T J = 25 °C, unless otherwise noted)
Vishay Siliconix
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Static
Gate Threshold Voltage
Gate-Body Leakage
Zero Gate Voltage Drain Current
On-State Drain Current a
Drain-Source On-State Resistance a
Forward Transconductance a
V GS(th)
I GSS
I DSS
I D(on)
R DS(on)
g fs
V DS = V GS , I D = -250 μA
V DS = 0 V, V GS = ± 20 V
V DS = -60 V, V GS = 0 V
V DS = -60 V, V GS = 0 V, T J = 70 °C
V DS ? -5 V, V GS = -10 V
V GS = -10 V, I D = -14.4 A
V GS = -4.5 V, I D = -12.6 A
V DS = -15 V, I D = -14.4 A
-1
-
-
-
-40
-
-
-
-
-
-
-
-
0.0115
0.0150
31
-3
± 100
-1
-10
-
0.0145
0.0190
-
V
nA
μA
A
?
S
Diode Forward
Voltage a
V SD
I S = -4.5 A, V GS = 0 V
-
-0.8
-1.2
V
Dynamic b
Total Gate Charge
Q g
-
121
190
Gate-Source Charge
Gate-Drain Charge
Gate Resistance
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Source-Drain Reverse Recovery Time
Q gs
Q gd
R g
t d(on)
t r
t d(off)
t f
t rr
V DS = -30 V, V GS = -10 V, I D = -14.4 A
V DD = -30 V, R L = 30 ?
I D ? -1 A, V GEN = -10 V, R g = 6 ?
I F = -4.5 A, dI/dt = 100 A/μs
-
-
-
-
-
-
-
-
20
32
3
20
20
205
90
45
-
-
-
30
30
310
135
70
nC
?
ns
Notes
a. Pulse test; pulse width ? 300 μs, duty cycle ? 2 %.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
S13-2282-Rev. H, 04-Nov-13
2
Document Number: 72567
For technical questions, contact: pmostechsupport@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
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