参数资料
| 型号： | SN74ABT8952DW |
| 厂商： | Texas Instruments |
| 文件页数： | 12/31页 |
| 文件大小： | 0K |
| 描述： | IC SCAN-TEST-DEV/XCVR 28-SOIC |
| 标准包装： | 20 |
| 系列： | 74ABT |
| 逻辑类型： | 扫描测试设备，带寄存总线收发器 |
| 电源电压： | 4.5 V ~ 5.5 V |
| 位数： | 8 |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 28-SOIC（0.295"，7.50mm 宽） |
| 供应商设备封装： | 28-SOIC |
| 包装： | 管件 |
| 产品目录页面： | 925 (CN2011-ZH PDF) |
| 其它名称： | 296-4116-5 |
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SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Data flow in each direction is controlled by clock (CLKAB and CLKBA), clock-enable (CLKENAB and
CLKENBA), and output-enable (OEAB and OEBA) inputs. For A-to-B data flow, A-bus data is stored in the
associated registers on the low-to-high transition of CLKAB, provided that CLKENAB is low. Otherwise, if
CLKENAB is high or CLKAB remains at a static low or high level, the register contents are not changed. When
OEAB is low, the B outputs are active. When OEAB is high, the B outputs are in the high-impedance state.
Control for B-to-A data flow is similar to that for A-to-B, but uses CLKBA, CLKENBA, and OEBA.
In the test mode, the normal operation of the SCOPE
registered bus transceivers is inhibited, and the test
circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry
performs boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO),
test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions
such as parallel signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from
data outputs. All testing and scan operations are synchronized to the TAP interface.
The SN54ABT8952 is characterized for operation over the full military temperature range of –55
°C to 125°C.
The SN74ABT8952 is characterized for operation from –40
°C to 85°C.
FUNCTION TABLE
(normal mode, each register)
INPUTS
OUTPUT
OEAB
CLKENAB
CLKAB
A
B
L
↑
L
↑
HH
L
HX
X
B0
L
XL
X
B0
H
X
Z
A-to-B data flow is shown; B-to-A data flow is similar
but uses OEBA, CLKENBA, and CLKBA.
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相关代理商/技术参数 |
参数描述 |
|---|---|
| SN74ABT8952DWE4 | 功能描述:特定功能逻辑 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT8952DWG4 | 功能描述:特定功能逻辑 Scan Test Devices RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT8952DWR | 功能描述:特定功能逻辑 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT8952DWRE4 | 功能描述:特定功能逻辑 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT8952DWRG4 | 功能描述:特定功能逻辑 Scan Test Devices RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
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