参数资料
型号: SN74ABT8952DW
厂商: Texas Instruments
文件页数: 6/31页
文件大小: 0K
描述: IC SCAN-TEST-DEV/XCVR 28-SOIC
标准包装: 20
系列: 74ABT
逻辑类型: 扫描测试设备,带寄存总线收发器
电源电压: 4.5 V ~ 5.5 V
位数: 8
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 28-SOIC(0.295",7.50mm 宽)
供应商设备封装: 28-SOIC
包装: 管件
产品目录页面: 925 (CN2011-ZH PDF)
其它名称: 296-4116-5
SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
14
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
pseudo-random pattern generation (PRPG)
A pseudo-random pattern is generated in the shift-register elements of the selected BSCs on each rising edge
of TCK, updated in the shadow latches, and applied to the associated device output pins on each falling edge
of TCK. This data also is updated in the shadow latches of the selected input BSCs and applied to the inputs
of the normal on-chip logic. Figures 4 and 5 illustrate the 16-bit linear-feedback shift-register algorithms through
which the patterns are generated. An initial seed value should be scanned into the BSR before performing this
operation. A seed value of all zeroes does not produce additional patterns.
=
A8-I
B8-O
A7-I
A6-I
A5-I
A4-I
A3-I
A2-I
A1-I
B7-O
B6-O
B5-O
B4-O
B3-O
B2-O
B1-O
Figure 4. 16-Bit PRPG Configuration (OEAB = 0, OEBA = 1)
=
B8-I
A8-O
B7-I
B6-I
B5-I
B4-I
B3-I
B2-I
B1-I
A7-O
A6-O
A5-O
A4-O
A3-O
A2-O
A1-O
Figure 5. 16-Bit PRPG Configuration (OEAB = 1, OEBA = 0)
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SN74ABT8952DWR 功能描述:特定功能逻辑 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube
SN74ABT8952DWRE4 功能描述:特定功能逻辑 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube
SN74ABT8952DWRG4 功能描述:特定功能逻辑 Scan Test Devices RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube