参数资料
| 型号： | SN74ABT8952DW |
| 厂商： | Texas Instruments |
| 文件页数： | 2/31页 |
| 文件大小： | 0K |
| 描述： | IC SCAN-TEST-DEV/XCVR 28-SOIC |
| 标准包装： | 20 |
| 系列： | 74ABT |
| 逻辑类型： | 扫描测试设备，带寄存总线收发器 |
| 电源电压： | 4.5 V ~ 5.5 V |
| 位数： | 8 |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 28-SOIC（0.295"，7.50mm 宽） |
| 供应商设备封装： | 28-SOIC |
| 包装： | 管件 |
| 产品目录页面： | 925 (CN2011-ZH PDF) |
| 其它名称： | 296-4116-5 |
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SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
10
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
boundary-control register
The boundary-control register (BCR) is 11 bits long. The BCR is used in the context of the RUNT instruction to
implement additional test operations not included in the basic SCOPE
instruction set. Such operations include
PRPG, PSA with input masking, and binary count up (COUNT). Table 4 shows the test operations that are
decoded by the BCR.
During Capture-DR, the contents of the BCR are not changed. At power up or in Test-Logic-Reset, the BCR is
reset to the binary value 00000000010, which selects the PSA test operation with no input masking.
The BCR order of scan is from TDI through bits 10–0 to TDO. Table 2 shows the BCR bits and their associated
test control signals.
Table 2. Boundary-Control Register Configuration
BCR BIT
NUMBER
TEST
CONTROL
SIGNAL
BCR BIT
NUMBER
TEST
CONTROL
SIGNAL
BCR BIT
NUMBER
TEST
CONTROL
SIGNAL
10
MASK8
6
MASK4
2
OPCODE2
9
MASK7
5
MASK3
1
OPCODE1
8
MASK6
4
MASK2
0
OPCODE0
7
MASK5
3
MASK1
––
bypass register
The bypass register is a 1-bit scan path that can be selected to shorten the length of the system scan path,
thereby reducing the number of bits per test pattern that must be applied to complete a test operation.
During Capture-DR, the bypass register captures a logic 0. The bypass register order of scan is shown in
Figure 3.
Bit 0
TDO
TDI
Figure 3. Bypass Register Order of Scan
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相关代理商/技术参数 |
参数描述 |
|---|---|
| SN74ABT8952DWE4 | 功能描述:特定功能逻辑 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT8952DWG4 | 功能描述:特定功能逻辑 Scan Test Devices RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT8952DWR | 功能描述:特定功能逻辑 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT8952DWRE4 | 功能描述:特定功能逻辑 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT8952DWRG4 | 功能描述:特定功能逻辑 Scan Test Devices RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
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