参数资料
型号: SN74LVTH18516
厂商: Texas Instruments, Inc.
英文描述: 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器))
中文描述: 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器(3.3VABT扫描测试装置(18位通用总线收发器))
文件页数: 11/36页
文件大小: 769K
代理商: SN74LVTH18516
SN54LVTH18516, SN54LVTH182516, SN74LVTH18516, SN74LVTH182516
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS672B – AUGUST 1996 – REVISED JUNE 1997
11
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
data register description
boundary-scan register
The boundary-scan register (BSR) is 46 bits long. It contains one boundary-scan cell (BSC) for each
normal-function input pin and one BSC for each normal-function I/O pin (one single cell for both input data and
output data). The BSR is used 1) to store test data that is to be applied externally to the device output pins,
and/or 2) to capture data that appears internally at the outputs of the normal on-chip logic and/or externally at
the device input pins.
The source of data to be captured into the BSR during Capture-DR is determined by the current instruction. The
contents of the BSR can change during Run-Test/Idle, as determined by the current instruction. At power up
or in Test-Logic-Reset, BSCs 45–44 are reset to logic 1, ensuring that these cells, which control A-port and
B-port outputs, are set to benign values (i.e., if test mode were invoked the outputs would be at high-impedance
state). Reset values of other BSCs should be considered indeterminate.
The BSR order of scan is from TDI through bits 45–0 to TDO. Table 1 shows the BSR bits and their associated
device pin signals.
Table 1. Boundary-Scan Register Configuration
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
45
OEAB
35
A18-I/O
17
B18-I/O
44
OEBA
34
A17-I/O
16
B17-I/O
43
LEAB
33
A16-I/O
15
B16-I/O
42
LEBA
32
A15-I/O
14
B15-I/O
41
CLKENAB
31
A14-I/O
13
B14-I/O
40
CLKENBA
30
A13-I/O
12
B13-I/O
39
CLKAB
29
A12-I/O
11
B12-I/O
38
CLKBA
28
A11-I/O
10
B11-I/O
37
SAB
27
A10-I/O
9
B10-I/O
36
SBA
26
A9-I/O
8
B9-I/O
––
––
25
A8-I/O
7
B8-I/O
––
––
24
A7-I/O
6
B7-I/O
––
––
23
A6-I/O
5
B6-I/O
––
––
22
A5-I/O
4
B5-I/O
––
––
21
A4-I/O
3
B4-I/O
––
––
20
A3-I/O
2
B3-I/O
––
––
19
A2-I/O
1
B2-I/O
––
––
18
A1-I/O
0
B1-I/O
P
相关PDF资料
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SN54LVTH182516 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器))
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