参数资料
型号: SN74LVTH18516
厂商: Texas Instruments, Inc.
英文描述: 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器))
中文描述: 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器(3.3VABT扫描测试装置(18位通用总线收发器))
文件页数: 33/36页
文件大小: 769K
代理商: SN74LVTH18516
SN54LVTH18516, SN54LVTH182516, SN74LVTH18516, SN74LVTH182516
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS672B – AUGUST 1996 – REVISED JUNE 1997
33
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
SN54LVTH182516
MIN
TYP
SN74LVTH182516
MIN
TYP
UNIT
MAX
MAX
Ci
Cio
Co
VI = 3 V or 0
VO = 3 V or 0
VO = 3 V or 0
4
4
pF
10
10
pF
8
8
pF
All typical values are at VCC = 3.3 V, TA = 25
°
C.
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (normal mode) (see Figure 15)
123
SN54LVTH182516
VCC = 3.3 V
±
0.3 V
SN74LVTH182516
VCC = 3.3 V
±
0.3 V
UNIT
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
Clock frequency
CLKAB or CLKBA
0
100
MHz
tw
Pulse duration
CLKAB or CLKBA high or low
5
ns
LEAB or LEBA high
A before CLKAB
or
B before CLKBA
4
ns
Setup time
4
tsu
A before LEAB
or
B before LEBA
CLK high
2
ns
CLK low
2
CLKEN before CLK
A after CLKAB
or
B after CLKBA
A after LEAB
or B after LEBA
CLKEN after CLK
3
th
Hold time
2
ns
4
1
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (test mode) (see Figure 15)
SN54LVTH182516
VCC = 3.3 V
±
0.3 V
SN74LVTH182516
VCC = 3.3 V
±
0.3 V
UNIT
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
tw
Clock frequency
TCK
0
50
MHz
Pulse duration
TCK high or low
9.5
ns
tsu
Setup time
A, B, CLK, CLKEN, LE,
OE or S before TCK
TDI before TCK
TMS before TCK
A, B, CLK, CLKEN,
OE or S after TCK
TDI after TCK
TMS after TCK
Power up to TCK
VCC power up
6.5
ns
2.5
2.5
th
Hold time
1.5
ns
1.5
1.5
td
tr
Delay time
50
ns
μ
s
Rise time
1
P
相关PDF资料
PDF描述
SN54LVTH182516 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器))
SN74LVTH182516 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(18位通用总线收发器))
SN54LVTH18640 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器))
SN54LVTH182640 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器))
SN74LVTH182640 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器))
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