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| 型号： | SN74LVTH18516 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器（3.3VABT扫描测试装置（18位通用总线收发器）） |
| 文件页数： | 2/36页 |
| 文件大小： | 769K |
| 代理商： | SN74LVTH18516 |
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SN54LVTH18516, SN54LVTH182516, SN74LVTH18516, SN74LVTH182516
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS672B – AUGUST 1996 – REVISED JUNE 1997
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
B5
V
CC
B6
B7
B8
GND
B9
B10
NC
B11
B12
GND
B13
B14
B15
V
CC
B16
A5
V
CC
A6
A7
A8
GND
A9
A10
NC
A11
A12
GND
A13
A14
A15
V
CC
A16
L
N
C
A
A
G
A
A
N
O
N
T
L
G
S
C
T
T
A
A
S
B
N
G
B
B
B
G
B
B
SN54LVTH18516, SN54LVTH182516 . . . HV PACKAGE
(TOP VIEW)
NC – No internal connection
28 29
60
59
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44
30
10
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31 32 33 34
8 7
6
5
4
9
3
1 68 67
2
35 36 37 38 39
66 65
27
64 63 62 61
40 41 42 43
T
C
O
C
description
The ’LVTH18516 and ’LVTH182516 scan test devices with 18-bit bus transceivers are members of the Texas
Instruments SCOPE
testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990
boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port (TAP) interface.
Additionally, these devices are designed specifically for low-voltage (3.3-V) V
CC
operation, but with the
capability to provide a TTL interface to a 5-V system environment.
In the normal mode, these devices are 18-bit universal bus transceivers that combine D-type latches and D-type
flip-flops to allow data flow in transparent, latched, or clock modes and that also allow for multiplexed
transmission of data directly from the input bus or from the internal registers. The test circuitry can be activated
by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the
boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the
SCOPE
universal bus transceivers.
P
相关PDF资料 |
PDF描述 |
|---|---|
| SN54LVTH182516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| SN74LVTH182516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(18位通用总线收发器)) |
| SN54LVTH18640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| SN54LVTH182640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| SN74LVTH182640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
相关代理商/技术参数 |
参数描述 |
|---|---|
| SN74LVTH18646APM | 功能描述:特定功能逻辑 3.3-V ABT w/18-Bit Trnscvr & Register RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH18646APMG4 | 功能描述:特定功能逻辑 3.3-V ABT w/18-Bit Trnscvr & Register RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH18652APM | 功能描述:特定功能逻辑 3.3-V ABT w/18-Bit Trnscvr & Register RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH18652APMG4 | 功能描述:特定功能逻辑 3.3-V ABT w/18-Bit Trnscvr & Register RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH2245DBR | 功能描述:总线收发器 Tri-St ABT Octal Bus RoHS:否 制造商:Fairchild Semiconductor 逻辑类型:CMOS 逻辑系列:74VCX 每芯片的通道数量:16 输入电平:CMOS 输出电平:CMOS 输出类型:3-State 高电平输出电流:- 24 mA 低电平输出电流:24 mA 传播延迟时间:6.2 ns 电源电压-最大:2.7 V, 3.6 V 电源电压-最小:1.65 V, 2.3 V 最大工作温度:+ 85 C 封装 / 箱体:TSSOP-48 封装:Reel |
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