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参数资料
| 型号： | STR635FZ1T6 |
| 厂商： | STMICROELECTRONICS |
| 元件分类： | 微控制器/微处理器 |
| 英文描述： | 32-BIT, FLASH, 36 MHz, RISC MICROCONTROLLER, PQFP144 |
| 封装： | 20 X 20 MM, TQFP-144 |
| 文件页数： | 32/51页 |
| 文件大小： | 1485K |
| 代理商： | STR635FZ1T6 |
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Electrical parameters
STR73xF
38/51
sample. This test conforms to the EIA/JESD 78 IC latch-up standard. For more details,
refer to the application note AN1181.
●
DLU: Electro-Static Discharges (one positive then one negative test) are applied to
each pin of 3 samples when the micro is running to assess the latch-up performance in
dynamic mode. Power supplies are set to the typical values, the oscillator is connected
as near as possible to the pins of the micro and the component is put in reset mode.
This test conforms to the IEC1000-4-2 and SAEJ1752/3 standards. For more details,
refer to the application note AN1181.
Electrical Sensitivities
Notes:
1.
Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the
JEDEC specifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B
Class strictly covers all the JEDEC criteria (international standard).
Symbol
Parameter
Conditions
Class 1)
LU
Static latch-up class
TA=+25°C
TA=+85°C
TA=+105°C
A
DLU
Dynamic latch-up class
VDD=5.5V, fOSC4M=4MHz, fMCLK=32MHz, TA=+25°C
A
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