参数资料
型号: TMS470R1B768PGEQR
厂商: TEXAS INSTRUMENTS INC
元件分类: 微控制器/微处理器
英文描述: 32-BIT, FLASH, 60 MHz, RISC MICROCONTROLLER, PQFP144
封装: PLASTIC, LQFP-144
文件页数: 3/49页
文件大小: 552K
代理商: TMS470R1B768PGEQR
www.ti.com ......................................................................................................................................................... SPNS108B – AUGUST 2005 – REVISED MAY 2008
Table 2. Terminal Functions (continued)
TERMINAL
INTERNAL
TYPE(1)(2)
PULLUP/
DESCRIPTION
NAME
NO.
PULLDOWN(3)
TEST/DEBUG (T/D) (CONTINUED)
Test enable. Reserved for internal use only. TI recommends that this pin be
TEST
38
3.3-V I
IPD (20 A)
connected to ground or pulled down to ground by an external resistor.
Serial input for controlling the state of the CPU test access port (TAP)
TMS
120
3.3-V I
IPU (20 A)
controller (JTAG)
Serial input for controlling the second TAP. TI recommends that this pin be
TMS2
121
3.3-V I
IPU (20 A)
connected to VCCIO or pulled up to VCCIO by an external resistor.
Test hardware reset to TAP1 and TAP2. IEEE Standard 1149-1 (JTAG)
TRST
37
3.3-V I
IPD (20 A)
Boundary-Scan Logic. TI recommends that this pin be pulled down to ground
by an external resistor.
FLASH
Flash test pad 1. For proper operation, this pin must not be connected
FLTP1
134
NC
[no connect (NC)].
Flash test pad 2. For proper operation, this pin must not be connected
FLTP2
133
NC
[no connect (NC)].
Flash external pump voltage (3.3 V). This pin is required for both flash read
VCCP
135
3.3-V PWR
and flash program and erase operations.
SUPPLY VOLTAGE CORE (1.8 V)
14
31
55
VCC
86
1.8-V PWR
Core logic supply voltage
93
128
132
SUPPLY VOLTAGE DIGITAL I/O (3.3 V)
17
VCCIO
53
3.3-V PWR
Digital I/O supply voltage
82
SUPPLY GROUND CORE
11
30
54
85
VSS
GND
Core supply ground reference
92
127
131
136
SUPPLY GROUND DIGITAL I/O
16
VSSIO
52
GND
Digital I/O supply ground reference
81
Copyright 2005–2008, Texas Instruments Incorporated
11
Product Folder Link(s): TMS470R1B768
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