参数资料
| 型号： | XC3S200A-4VQ100I |
| 厂商： | Xilinx Inc |
| 文件页数： | 65/132页 |
| 文件大小： | 0K |
| 描述： | IC FPGA SPARTAN 3 100VQFP |
| 标准包装： | 90 |
| 系列： | Spartan®-3A |
| LAB/CLB数： | 448 |
| 逻辑元件/单元数： | 4032 |
| RAM 位总计： | 294912 |
| 输入/输出数： | 68 |
| 门数： | 200000 |
| 电源电压： | 1.14 V ~ 1.26 V |
| 安装类型： | 表面贴装 |
| 工作温度： | -40°C ~ 100°C |
| 封装/外壳： | 100-TQFP |
| 供应商设备封装： | 100-VQFP（14x14） |
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DC and Switching Characteristics
38
DS529-3 (v2.0) August 19, 2010
Using IBIS Models to Simulate Load Conditions in Application
IBIS models permit the most accurate prediction of timing
delays for a given application. The parameters found in the
IBIS model (VREF, RREF, and VMEAS) correspond directly
not confuse VREF (the termination voltage) from the IBIS
model with VREF (the input-switching threshold) from the
table. A fourth parameter, CREF, is always zero. The four
parameters describe all relevant output test conditions. IBIS
models are found in the Xilinx development software as well
as at the following link:
Delays for a given application are simulated according to its
specific load conditions as follows:
1.
Simulate the desired signal standard with the output
driver connected to the test setup shown in Figure 9.
CREF is zero.
2.
Record the time to VM.
3.
Simulate the same signal standard with the output driver
connected to the PCB trace with load. Use the
appropriate IBIS model (including VREF, RREF, CREF,
and VMEAS values) or capacitive value to represent the
load.
4.
Record the time to VMEAS.
5.
Compare the results of steps 2 and 4. Add (or subtract)
the increase (or decrease) in delay to (or from) the
appropriate Output standard adjustment (Table 26) to
yield the worst-case delay of the PCB trace.
Simultaneously Switching Output Guidelines
This section provides guidelines for the recommended
maximum allowable number of Simultaneous Switching
Outputs (SSOs). These guidelines describe the maximum
number of user I/O pins of a given output signal standard
that should simultaneously switch in the same direction,
while maintaining a safe level of switching noise. Meeting
these guidelines for the stated test conditions ensures that
the FPGA operates free from the adverse effects of ground
and power bounce.
Ground or power bounce occurs when a large number of
outputs simultaneously switch in the same direction. The
output drive transistors all conduct current to a common
voltage rail. Low-to-High transitions conduct to the VCCO
rail; High-to-Low transitions conduct to the GND rail. The
resulting cumulative current transient induces a voltage
difference across the inductance that exists between the die
pad and the power supply or ground return. The inductance
is associated with bonding wires, the package lead frame,
and any other signal routing inside the package. Other
variables contribute to SSO noise levels, including stray
inductance on the PCB as well as capacitive loading at
receivers. Any SSO-induced voltage consequently affects
internal switching noise margins and ultimately signal
quality.
For each device/package combination, Table 28 provides
the number of equivalent VCCO/GND pairs. The equivalent
number of pairs is based on characterization and may not
match the physical number of pairs. For each output signal
standard and drive strength, Table 29 recommends the
maximum number of SSOs, switching in the same direction,
allowed per VCCO/GND pair within an I/O bank. The
guidelines in Table 29 are categorized by package style,
slew rate, and output drive current. Furthermore, the
number of SSOs is specified by I/O bank. Generally, the left
and right I/O banks (Banks 1 and 3) support higher output
drive current.
Multiply the appropriate numbers from Table 28 and
Table 29 to calculate the maximum number of SSOs allowed
within an I/O bank. Exceeding these SSO guidelines might
result in increased power or ground bounce, degraded
signal integrity, or increased system jitter.
The recommended maximum SSO values assume that the
FPGA is soldered on the printed circuit board and that the
board uses sound design practices. The SSO values do not
apply for FPGAs mounted in sockets, due to the lead
inductance introduced by the socket.
The SSO values assume that the VCCAUX is powered at
3.3V. Setting VCCAUX to 2.5V provides better SSO
characteristics.
The number of SSOs allowed for quad-flat packages
(VQ/TQ) is lower than for ball grid array packages (FG) due
to the larger lead inductance of the quad-flat packages. Ball
grid array packages are recommended for applications with
a large number of simultaneously switching outputs.
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相关代理商/技术参数 |
参数描述 |
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| XC3S200A-4VQG100C | 功能描述:IC FPGA SPARTAN-3A 200K 100-VQFP RoHS:是 类别:集成电路 (IC) >> 嵌入式 - FPGA（现场可编程门阵列） 系列:Spartan®-3A 标准包装:40 系列:Spartan® 6 LX LAB/CLB数:3411 逻辑元件/单元数:43661 RAM 位总计:2138112 输入/输出数:358 门数:- 电源电压:1.14 V ~ 1.26 V 安装类型:表面贴装 工作温度:-40°C ~ 100°C 封装/外壳:676-BGA 供应商设备封装:676-FBGA（27x27） |
| XC3S200A-4VQG100I | 功能描述:IC FPGA SPARTAN-3A 200K 100-VQFP RoHS:是 类别:集成电路 (IC) >> 嵌入式 - FPGA（现场可编程门阵列） 系列:Spartan®-3A 标准包装:24 系列:ECP2 LAB/CLB数:1500 逻辑元件/单元数:12000 RAM 位总计:226304 输入/输出数:131 门数:- 电源电压:1.14 V ~ 1.26 V 安装类型:表面贴装 工作温度:0°C ~ 85°C 封装/外壳:208-BFQFP 供应商设备封装:208-PQFP（28x28） |
| XC3S200A-5FG320C | 功能描述:IC SPARTAN-3A FPGA 200K 320FBGA RoHS:否 类别:集成电路 (IC) >> 嵌入式 - FPGA（现场可编程门阵列） 系列:Spartan®-3A 标准包装:40 系列:Spartan® 6 LX LAB/CLB数:3411 逻辑元件/单元数:43661 RAM 位总计:2138112 输入/输出数:358 门数:- 电源电压:1.14 V ~ 1.26 V 安装类型:表面贴装 工作温度:-40°C ~ 100°C 封装/外壳:676-BGA 供应商设备封装:676-FBGA（27x27） |
| XC3S200A-5FGG320C | 功能描述:IC SPARTAN-3A FPGA 200K 320-FBGA RoHS:是 类别:集成电路 (IC) >> 嵌入式 - FPGA（现场可编程门阵列） 系列:Spartan®-3A 标准包装:40 系列:Spartan® 6 LX LAB/CLB数:3411 逻辑元件/单元数:43661 RAM 位总计:2138112 输入/输出数:358 门数:- 电源电压:1.14 V ~ 1.26 V 安装类型:表面贴装 工作温度:-40°C ~ 100°C 封装/外壳:676-BGA 供应商设备封装:676-FBGA（27x27） |
| XC3S200A-5FT256C | 功能描述:IC SPARTAN-3A FPGA 200K 256FTBGA RoHS:否 类别:集成电路 (IC) >> 嵌入式 - FPGA（现场可编程门阵列） 系列:Spartan®-3A 标准包装:40 系列:Spartan® 6 LX LAB/CLB数:3411 逻辑元件/单元数:43661 RAM 位总计:2138112 输入/输出数:358 门数:- 电源电压:1.14 V ~ 1.26 V 安装类型:表面贴装 工作温度:-40°C ~ 100°C 封装/外壳:676-BGA 供应商设备封装:676-FBGA（27x27） |
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