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参数资料
| 型号： | AD7703AR |
| 厂商： | Analog Devices Inc |
| 文件页数： | 11/16页 |
| 文件大小： | 0K |
| 描述： | IC ADC 20BIT LC2MOS 20-SOIC |
| 标准包装： | 1 |
| 位数： | 20 |
| 采样率（每秒）： | 4k |
| 数据接口： | 串行 |
| 转换器数目： | 1 |
| 功率耗散（最大）： | 37mW |
| 电压电源： | 模拟和数字，双 ± |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 20-SOIC（0.295"，7.50mm 宽） |
| 供应商设备封装： | 20-SOIC W |
| 包装： | 管件 |
| 输入数目和类型： | 1 个单端，单极；1 个单端，双极 |
REV. E
–4–
AD7703
Limit at TMIN, TMAX
Parameter
(A, B Versions)
(S, T Versions)
Unit
Conditions/Comments
fCLKIN
3, 4
200
kHz min
Master Clock Frequency: Internal Gate Oscillator
55
MHz max Typically 4.096 MHz
200
kHz min
Master Clock Frequency: Externally Supplied
55
MHz max
tr
5
50
ns max
Digital Output Rise Time. Typically 20 ns.
tf
5
50
ns max
Digital Output Fall Time. Typically 20 ns.
t1
00
ns min
SC1, SC2 to CAL High Setup Time
t2
50
ns min
SC1, SC2 Hold Time after CAL Goes High
t3
6
1000
ns min
SLEEP High to CLKIN High Setup Time
SSC MODE
t4
7
3/fCLKIN
ns max
Data Access Time (CS Low to Data Valid)
t5
100
ns max
SCLK Falling Edge to Data Valid Delay (25 ns typ)
t6
250
ns min
MSB Data Setup Time. Typically 380 ns.
7
300
ns max
SCLK High Pulsewidth. Typically 240 ns.
t8
790
ns max
SCLK Low Pulsewidth. Typically 730 ns.
t9
8
l/fCLKIN + 200
ns max
SCLK Rising Edge to Hi-Z Delay (l/fCLKIN + 100 ns typ)
t10
8, 9
4/fCLKIN + 200
ns max
CS High to Hi-Z Delay
SEC MODE
fSCLK
55
MHz max Serial Clock Input Frequency
t11
35
ns min
SCLK Input High Pulsewidth
t12
160
ns min
SCLK Low Pulsewidth
t13
7, 10
160
ns max
Data Access Time (CS Low to Data Valid). Typically 80 ns.
t14
11
150
ns max
SCLK Falling Edge to Data Valid Delay. Typically 75 ns.
t15
8
250
ns max
CS High to Hi-Z Delay
t16
8
200
ns max
SCLK Falling Edge to Hi-Z Delay. Typically 100 ns.
NOTES
1Sample tested at 25°C to ensure compliance. All input signals are specified with t
r = tf = 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V.
2See Figures 1 to 6.
3CLKIN duty cycle range is 20% to 80%. CLKIN must be supplied whenever the AD7703 is not in SLEEP mode. If no clock is present in this case, the device
can draw higher current than specified and possibly become uncalibrated.
4The AD7703 is production tested with f
CLKIN at 4.096 MHz. It is guaranteed by characterization to operate at 200 kHz.
5Specified using 10% and 90% points on waveform of interest.
6In order to synchronize several AD7703s together using the SLEEP pin, this specification must be met.
7t
4 and t13 are measured with the load circuit of Figure 1 and defined as the time required for an output to cross 0.8 V or 2.4 V.
8t
9, t10, t15, and t16 are derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 1. The measured number
is then extrapolated back to remove the effects of charging or discharging the 100 pF capacitor. This means that the time quoted in the Timing Characteristics is
the true bus relinquish time of the part and as such is independent of external bus loading capacitance.
9If CS is returned high before all 20 bits are output, the SDATA and SCLK outputs will complete the current data bit and then go to high impedance.
10If CS is activated asynchronously to DRDY, CS will not be recognized if it occurs when DRDY is high for four clock cycles. The propagation delay time may be
as great as four CLKIN cycles plus 160 ns. To guarantee proper clocking of SDATA when using asynchronous CS, the SCLK input should not be taken high
sooner than four CLKIN cycles plus 160 ns after CS goes low.
11SDATA is clocked out on the falling edge of the SCLK input.
Specifications subject to change without notice.
TIMING CHARACTERISTICS1, 2
(AVDD = DVDD = +5 V
10%; AVSS = DVSS = –5 V
10%; AGND = DGND = O V;
fCLKIN = 4.096 MHz; Input Levels: Logic O = O V, Logic 1 = DVDD; unless otherwise noted.)
CL
100pF
TO
OUTPUT
PIN
IOH
200 A
2.1V
+
IOL
1.6mA
Figure 1. Load Circuit for Access Time
and Bus Relinquish Time
CAL
SC1, SC2
SC1, SC2 VALID
t
1
t
2
Figure 2. Calibration Control Timing
CLKIN
SLEEP
t
3
Figure 3. Sleep Mode Timing
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