参数资料
型号: ADSP-BF525KBCZ-6C2
厂商: Analog Devices Inc
文件页数: 76/88页
文件大小: 0K
描述: IC DSP 16BIT 600MHZ 289CSPBGA
产品变化通告: Datasheet Specification Change 14/Dec/2009
标准包装: 1
系列: Blackfin®
类型: 定点
接口: DMA,I²C,PPI,SPI,SPORT,UART,USB
时钟速率: 600MHz
非易失内存: ROM(32 kB)
芯片上RAM: 132kB
电压 - 输入/输出: 1.8V,2.5V,3.3V
电压 - 核心: 1.10V
工作温度: 0°C ~ 70°C
安装类型: 表面贴装
封装/外壳: 289-LFBGA,CSPBGA
供应商设备封装: 289-CSPBGA(12x12)
包装: 托盘
ADSP-BF522/ADSP-BF523/ADSP-BF524/ADSP-BF525/ADSP-BF526/ADSP-BF527
Output Disable Time Measurement
TESTER PIN ELECTRONICS
Output balls are considered to be disabled when they stop driv-
ing, go into a high impedance state, and start to decay from their
output high or low voltage. The output disable time t DIS is the
difference between t DIS_MEASURED and t DECAY as shown on the left
side of Figure 59 .
t DIS = t DIS_MEASURED – t DECAY
The time for the voltage on the bus to decay by ΔV is dependent
V LOAD
4pF
50 Ω
70 Ω
50 Ω
2pF
45 Ω
0.5pF
T1
ZO = 50 Ω (impedance)
TD = 4.04 ± 1.18 ns
DUT
OUTPUT
on the capacitive load C L and the load current I L . This decay
time can be approximated by the equation:
t DECAY = ? C L ? V ? ? I L
NOTES:
400 Ω
The time t DECAY is calculated with test loads C L and I L , and with
? V equal to 0.25 V for V DDEXT /V DDMEM (nominal) = 2.5 V/3.3 V
and 0.15 V for V DDEXT /V DDMEM (nominal) = 1.8V.
The time t DIS_MEASURED is the interval from when the reference
signal switches, to when the output voltage decays ΔV from the
measured output high or output low voltage.
Example System Hold Time Calculation
To determine the data output hold time in a particular system,
first calculate t DECAY using the equation given above. Choose ΔV
to be the difference between the processor’s output voltage and
the input threshold for the device requiring the hold time. C L is
the total bus capacitance (per data line), and I L is the total leak-
age or three-state current (per data line). The hold time will be
t DECAY plus the various output disable times as specified in the
Timing Specifications on Page 39 (for example t DSDAT for an
SDRAM write cycle as shown in SDRAM Interface Timing on
Page 47 ).
THE WORST CASE TRANSMISSION LINE DELAY IS SHOWN AND CAN BE USED
FOR THE OUTPUT TIMING ANALYSIS TO REFELECT THE TRANSMISSION LINE
EFFECT AND MUST BE CONSIDERED. THE TRANSMISSION LINE (TD) IS FOR
LOAD ONLY AND DOES NOT AFFECT THE DATA SHEET TIMING SPECIFICATIONS.
ANALOG DEVICES RECOMMENDS USING THE IBIS MODEL TIMING FOR A GIVEN
SYSTEM REQUIREMENT. IF NECESSARY, A SYSTEM MAY INCORPORATE
EXTERNAL DRIVERS TO COMPENSATE FOR ANY TIMING DIFFERENCES.
Figure 60. Equivalent Device Loading for AC Measurements
(Includes All Fixtures)
12
10
t RISE
8
t FALL
6
4
Capacitive Loading
Output delays and holds are based on standard capacitive loads
of an average of 6 pF on all balls (see Figure 60 ). V LOAD is equal
2
0
t RISE = 1.8V @ 25 °C
t FALL = 1.8V @ 25 °C
to (V DDEXT /V DDMEM ) /2. The graphs of Figure 61 through
0
50
100
150
200
Figure 72 show how output rise time varies with capacitance.
The delay and hold specifications given should be derated by a
factor derived from these figures. The graphs in these figures
may not be linear outside the ranges shown.
LOAD CAPACITANCE (pF)
Figure 61. Driver Type A Typical Rise and Fall Times (10%–90%) vs.
Load Capacitance (1.8V V DDEXT /V DDMEM )
Rev. D
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Page 76 of 88 | July 2013
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