参数资料
型号: AGLE600V2-FGG256
厂商: Microsemi SoC
文件页数: 115/166页
文件大小: 0K
描述: IC FPGA 1KB FLASH 600K 256-FBGA
标准包装: 90
系列: IGLOOe
逻辑元件/单元数: 13824
RAM 位总计: 110592
输入/输出数: 165
门数: 600000
电源电压: 1.14 V ~ 1.575 V
安装类型: 表面贴装
工作温度: 0°C ~ 70°C
封装/外壳: 256-LBGA
供应商设备封装: 256-FPBGA(17x17)
IGLOOe DC and Switching Characteristics
2-38
Revision 13
2.5 V LVCMOS
Low-Voltage CMOS for 2.5 V is an extension of the LVCMOS standard (JESD8-5) used for general-
purpose 2.5 V applications.
Table 2-46 Minimum and Maximum DC Input and Output Levels
2.5 V LVCMOS
VIL
VIH
VOL
VOH IOL IOH
IOSH
IOSL
IIL1 IIH2
Drive
Strength
Min.
V
Max.
V
Min.
V
Max.
V
Max.
V
Min.
VmA mA
Max.
mA3
Max.
mA3
A4 A4
4 mA
–0.3
0.7
1.7
3.6
0.7
1.7
4
16
18
10 10
8 mA
–0.3
0.7
1.7
3.6
0.7
1.7
8
32
37
10 10
12 mA
–0.3
0.7
1.7
3.6
0.7
1.7
12 12
65
74
10 10
16 mA
–0.3
0.7
1.7
3.6
0.7
1.7
16 16
83
87
10 10
24 mA
–0.3
0.7
1.7
3.6
0.7
1.7
24 24
169
124
10 10
Notes:
1. IIL is the input leakage current per I/O pin over recommended operation conditions where –0.3 V < VIN < VIL.
2. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is
larger when operating outside recommended ranges.
3. Currents are measured at high temperature (100°C junction temperature) and maximum voltage.
4. Currents are measured at 85°C junction temperature.
5. Software default selection highlighted in gray.
Figure 2-8 AC Loading
Table 2-47 AC Waveforms, Measuring Points, and Capacitive Loads
Input Low (V)
Input High (V)
Measuring Point* (V)
VREF (typ.) (V)
CLOAD (pF)
02.5
1.2
5
Note: *Measuring point = Vtrip. See Table 2-23 on page 2-23 for a complete table of trip points.
Test Point
Enable Path
Datapath
35 pF
R = 1 k
R to VCCI for tLZ / tZL / tZLS
R to GND for tHZ / tZH / tZHS
5 pF for tZH / tZHS / tZL / tZLS
5 pF for tHZ / tLZ
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