参数资料
型号: DAC34SH84EVM
厂商: Texas Instruments
文件页数: 11/29页
文件大小: 0K
描述: EVAL MODULE FOR DAC34SH84
标准包装: 1
DAC 的数量: 4
位数: 16
采样率(每秒): 1.5G
数据接口: LVDS
设置时间: 10ns
DAC 型: 电流
工作温度: -40°C ~ 85°C
已供物品:
已用 IC / 零件: *
其它名称: 296-30857
DAC34SH84EVM-ND
Basic Test Procedure with TSW1400
3
3.1
3.2
Basic Test Procedure with TSW1400
This section outlines the basic test procedure for testing the EVM with the TSW1400.
TSW1400 Overview
The TSW1400 is a high speed data capture and pattern generator board. When functioning as a pattern
generator, it has a maximum LVDS bus rate of 1.5 GSPS, and this allows evaluation of the DAC348x with
maximum 750 MSPS of input data rate per channel.
See the TSW1400 user’s guide ( SLWU079 ) for more detailed explanation of the TSW1400 setup and
operation. This document assumes that the High Speed Data Converter Pro software ( SLWC107 ) is
installed and functioning properly.
Test Block Diagram for TSW1400
The test set-up for general testing of the DAC348x with the TSW1400 pattern generation card is shown in
PC
USB
USB
Signal
Generator
+5V
(CLK Source)
J5
J12
J4
J13
J9
J14
DAC348X
TSW1400
IF
Spectrum
Analyzer
J18
+6V
Figure 8. Test Set-up Block Diagram for TSW1400
SLAU432 – February 2012
Copyright ? 2012, Texas Instruments Incorporated
DAC348x EVM
11
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