参数资料
型号: DS2045W-100#
厂商: Maxim Integrated
文件页数: 6/12页
文件大小: 0K
描述: IC NVSRAM 1MBIT 100NS 256BGA
标准包装: 1
格式 - 存储器: RAM
存储器类型: NVSRAM(非易失 SRAM)
存储容量: 1M (128K x 8)
速度: 100ns
接口: 并联
电源电压: 3 V ~ 3.6 V
工作温度: -40°C ~ 85°C
封装/外壳: 256-BBGA
供应商设备封装: 256-BGA(27x27)
包装: 托盘
DS2045W 3.3V Single-Piece 1Mb
Nonvolatile SRAM
Power-Down/Power-Up Condition
V CC
V TP
t DR
~ 2.5V
t F
t R
t REC
CE,
WE
BACKUP CURRENT
SUPPLIED FROM
LITHIUM BATTERY
RST
t PD
V OL
t RPD
SLEWS WITH
V CC
t PU
t RPU
V OL
V IH
(SEE NOTES 1, 7.)
Note 1: RST is an open-drain output and cannot source current. An external pullup resistor should be connected to this pin to real-
ize a logic-high level.
Note 2: These parameters are sampled with a 5pF load and are not 100% tested.
Note 3: t WP is specified as the logical AND of CE and WE . t WP is measured from the latter of CE or WE going low to the earlier of
CE or WE going high.
Note 4: t WR1 and t DH1 are measured from WE going high.
Note 5: t WR2 and t DH2 are measured from CE going high.
Note 6: t DS is measured from the earlier of CE or WE going high.
Note 7: In a power-down condition, the voltage on any pin can not exceed the voltage on V CC .
Note 8: The expected t DR is defined as accumulative time in the absence of V CC starting from the time power is first applied by the
user. Minimum expected data-retention time is based on a maximum of two +230°C convection solder reflow exposures,
followed by a fully charged cell. Full charge occurs with the initial application of V CC for a minimum of 96 hours. This para-
meter is assured by component selection, process control, and design. It is not measured directly in production testing.
Note 9: WE is high for a read cycle.
Note 10: OE = V IH or V IL . If OE = V IH during write cycle, the output buffers remain in a high-impedance state.
Note 11: If the CE low transition occurs simultaneously with or latter than the WE low transition, the output buffers remain in a high-
impedance state during this period.
Note 12: If the CE high transition occurs prior to or simultaneously with the WE high transition, the output buffers remain in a high-
impedance state during this period.
Note 13: If WE is low or the WE low transition occurs prior to or simultaneously with the CE low transition, the output buffers remain
in a high-impedance state during this period.
Note 14: DS2045W BGA modules are recognized by Underwriters Laboratory (UL) under file E99151.
6
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