参数资料
型号: DS21Q42T+
厂商: Maxim Integrated Products
文件页数: 98/116页
文件大小: 0K
描述: IC FRAMER ENHANCED T1 4X 128TQFP
标准包装: 72
控制器类型: T1 调帧器
接口: 并行/串行
电源电压: 2.97 V ~ 3.63 V
电流 - 电源: 75mA
工作温度: 0°C ~ 70°C
安装类型: 表面贴装
封装/外壳: 128-LQFP
供应商设备封装: 128-LQFP(14x20)
包装: 管件
DS21Q42
82 of 116
Update-IR
The instruction code shifted into the instruction shift register is latched into the parallel output on the
falling edge of JTCLK as the controller enters this state. Once latched, this instruction becomes the
current instruction. A rising edge on JTCLK with JTMS low, will put the controller in the Run-Test-Idle
state. With JTMS high, the controller will enter the Select-DR-Scan state.
Figure 19-2. TAP CONTROLLER STATE MACHINE
19.3 Instruction Register and Instructions
The instruction register contains a shift register as well as a latched parallel output and is 3 bits in length.
When the TAP controller enters the Shift-IR state, the instruction shift register will be connected between
JTDI and JTDO. While in the Shift-IR state, a rising edge on JTCLK with JTMS low will shift the data
one stage towards the serial output at JTDO. A rising edge on JTCLK in the Exit1-IR state or the Exit 2-
IR state with JTMS high will move the controller to the Update-IR state The falling edge of that same
JTCLK will latch the data in the instruction shift register to the instruction parallel output. Instructions
supported by the DS21Q42 with their respective operational binary codes are shown in Table 19-1.
1
0
1
11
1
11
1
00
0
1
0
1
0
Select
DR-Scan
Capture DR
Shift DR
Exit DR
Pause DR
Exit2 DR
Update DR
Select
IR-Scan
Capture IR
Shift IR
Exit IR
Pause IR
Exit2 IR
Update IR
Test Logic
Reset
Run Test/
Idle
0
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