参数资料
型号: FQA10N80C_F109
厂商: Fairchild Semiconductor
文件页数: 1/8页
文件大小: 0K
描述: MOSFET N-CH 800V 10A TO-3P
产品变化通告: Design/Process Change Notification 26/June/2007
标准包装: 30
系列: QFET™
FET 型: MOSFET N 通道,金属氧化物
FET 特点: 标准
漏极至源极电压(Vdss): 800V
电流 - 连续漏极(Id) @ 25° C: 10A
开态Rds(最大)@ Id, Vgs @ 25° C: 1.1 欧姆 @ 5A,10V
Id 时的 Vgs(th)(最大): 5V @ 250µA
闸电荷(Qg) @ Vgs: 58nC @ 10V
输入电容 (Ciss) @ Vds: 2800pF @ 25V
功率 - 最大: 240W
安装类型: 通孔
封装/外壳: TO-3P-3,SC-65-3
供应商设备封装: TO-3PN
包装: 管件
其它名称: FQA10N80C_F109-ND
FQA10N80C_F109FS
March 2014
FQA10N80C_F109
N-Channel QFET ? MOSFET
800 V, 10 A, 1.1 Ω
Features
? 10 A, 800 V, R DS(on) = 1.1 Ω (Max.) @ V GS = 10 V, I D = 5 A
? Low Gate Charge (Typ. 44 nC)
? Low Crss (Typ. 15 pF)
? 100% Avalanche Tested
? RoHS compliant
Description
This N-Channel enhancement mode power MOSFET is pro-
duced using Fairchild Semiconductor ’s proprietary planar stripe
and DMOS technology. This advanced MOSFET technology
has been especially tailored to reduce on-state resistance, and
to provide superior switching performance and high avalanche
energy strength. These devices are suitable for switched mode
power supplies, active power factor correction (PFC), and elec-
tronic lamp ballasts.
D
G
G
D
S
TO-3PN
S
MOSFET Maximum Ratings T C = 25 o C unless otherwise noted.
Symbol
Parameter
FQA10N80C_F109
Unit
V DSS
I D
Drain to Source Voltage
Drain Current
-Continuous (T C = 25 o C)
-Continuous (T C = 100 o C)
800
10
6.32
V
A
A
I DM
V GSS
Drain Current
Gate to Source Voltage
- Pulsed
(Note 1)
40
± 30
A
V
E AS
I AR
E AR
dv/dt
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
(Note 2)
(Note 1)
(Note 1)
(Note 3)
920
10
24
4.0
mJ
A
mJ
V/ns
P D
Power Dissipation
(T C = 25 o C)
- Derate above 25 o C
240
1.92
W
W/°C
T J , T STG
T L
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
-55 to +150
300
°C
°C
Thermal Characteristics
Symbol
Parameter
FQA10N80C_F109
Unit
R θ JC
R θ JA
Thermal Resistance, Junction to Case, Max
Thermal Resistance, Junction to Ambient, Max
0.52
40
o
o
C/W
C/W
?2006 Fairchild Semiconductor Corporation
FQA10N80C_F109 Rev. C2
1
www.fairchildsemi.com
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