参数资料
型号: IDT79RC32V333-100DHI
厂商: IDT, Integrated Device Technology Inc
文件页数: 30/30页
文件大小: 0K
描述: IC PROC 32BIT CPU 100MHZ 208-QFP
产品变化通告: Product Discontinuation 07/Dec/2009
标准包装: 24
系列: Interprise™
处理器类型: RISC 32-位
速度: 100MHz
电压: 3.3V
安装类型: 表面贴装
封装/外壳: 208-BFQFP
供应商设备封装: 208-PQFP(28x28)
包装: 托盘
其它名称: 79RC32V333-100DHI
9 of 30
May 4, 2004
IDT 79RC32333
spi_sck
I/O
L
Low
SPI Clock
Serial mode: Output pin for Serial Clock.
In PCI satellite mode, acts as an Output pin for Serial Clock for loading PCI Configuration Registers in the
RC323333 Reset Initialization Vector PCI boot mode.
1st Alternate function: PIO[5]. Defaults to the output direction at reset time.
2nd Alternate function: pci_eeprom_sk.
spi_ss_n
I/O
H
Low
SPI Chip Select
Output pin selecting the serial protocol device as opposed to the PCI satellite mode EEPROM device.
Alternate function: PIO[4]. Defaults to the output direction at reset time.
CPU Core Specific Signals
cpu_nmi_n
Input
CPU Non-Maskable Interrupt Requires an external pull-up.
This interrupt input is active low to the CPU.
cpu_masterclk
Input
CPU Master System Clock
Provides the basic system clock.
cpu_int_n[1:0]
Input
CPU Interrupt Requires an external pull-up.
These interrupt inputs are active low to the CPU.
cpu_coldreset_n
Input
L
CPU Cold Reset
This active-low signal is asserted to the RC32333 after
Vcc becomes valid on the initial power-up. The
Reset initialization vectors for the RC32333 are latched by cold reset.
cpu_dt_r_n
Output
Z
CPU Direction Transmit/Receive
This active-low signal controls the DT/R pin of an optional FCT245 transceiver bank. It is asserted during
read operations.
1st Alternate function: mem_245_dt_r_n.
2nd Alternate function: sdram_245_dt_r_n.
JTAG Interface Signals
jtag_tck
Input
JTAG Test Clock Requires an external pull-down.
An input test clock used to shift into or out of the Boundary-Scan register cells. jtag_tck is independent of
the system and the processor clock with nominal 50% duty cycle.
jtag_tdi,
ejtag_dint_n
Input
JTAG Test Data In Requires an external pull-up.
On the rising edge of jtag_tck, serial input data are shifted into either the Instruction or Data register,
depending on the TAP controller state. During Real Mode, this input is used as an interrupt line to stop the
debug unit from Real Time mode and return the debug unit back to Run Time Mode (standard JTAG).
This pin is also used as the ejtag_dint_n signal in the EJTAG mode.
jtag_tdo,
ejtag_tpc
Output
Z
High
JTAG Test Data Out
The jtag_tdo is serial data shifted out from instruction or data register on the falling edge of jtag_tck.
When no data is shifted out, the jtag_tdo is tri-stated. During Real Time Mode, this signal provides a non-
sequential program counter at the processor clock or at a division of processor clock. This pin is also
used as the ejtag_tpc signal in the EJTAG mode.
jtag_tms
Input
JTAG Test Mode Select Requires an external pull-up.
The logic signal received at the jtag_tms input is decoded by the TAP controller to control test operation.
jtag_tms is sampled on the rising edge of the jtag_tck.
jtag_trst_n
Input
L
JTAG Test Reset
When neither JTAG nor EJTAG are being used, jtag_trst_n must be driven low (pulled down) or the
jtag_tms/ejtag_tms signals must be pulled up and jtag_clk actively clocked.
ejtag_dclk
Output
Z
EJTAG Test Clock
Processor Clock. During Real Time Mode, this signal is used to capture address and data from the
ejtag_tpc signal at the processor clock speed or any division of the internal pipeline.
Name
Type
Reset
State
Status
Drive
Strength
Capability
Description
Table 1 Pin Descriptions (Part 5 of 6)
相关PDF资料
PDF描述
IDT79RC32V333-100DHG IC PROC 32BIT CPU 100MHZ 208-QFP
AMM18DREN CONN EDGECARD 36POS .156 EYELET
046288020000846+ CONN FFC/FPC 20POS .5MM R/A SMD
AMM18DREH CONN EDGECARD 36POS .156 EYELET
FMC31DRES-S93 CONN EDGECARD 62POS .100 EYELET
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