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| 型号： | LM5051MAX/NOPB |
| 厂商： | National Semiconductor |
| 文件页数： | 1/23页 |
| 文件大小： | 0K |
| 描述： | IC ORING FET CTRLR 8SOIC |
| 标准包装： | 2,500 |
| 应用： | 冗余电源 |
| FET 型： | N 沟道 |
| 输出数： | 1 |
| 内部开关： | 无 |
| 电源电压： | 36 V ~ 100 V |
| 电流 - 电源： | 400µA |
| 工作温度： | -40°C ~ 125°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 8-SOIC（0.154"，3.90mm 宽） |
| 供应商设备封装： | 8-SOICN |
| 包装： | 带卷 (TR) |
SNVS702D – OCTOBER 2011 – REVISED MARCH 2013
LM5051 Low Side OR-ing FET Controller
Check for Samples: LM5051
1
FEATURES
DESCRIPTION
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2
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Wide operating input voltage range: -6V to -
100V
-100V Transient Capability
Gate drive for external N-Channel MOSFET
MOSFET diagnostic test mode
Fast 50ns response to current reversal
2A peak gate turn-off current
Package: 8-Lead SOIC
The LM5051 Low Side OR-ing FET Controller
operates in conjunction with an external MOSFET as
an ideal diode rectifier when connected in series with
a power source. This OR-ing controller allows
MOSFETs to replace diode rectifiers in power
distribution networks thus reducing both power loss
and voltage drops.
The LM5051 controller provides gate drive for an
external N-Channel MOSFET and a fast response
comparator to turn off the FET when current flows in
APPLICATIONS
the reverse direction. The LM5051 can connect
power supplies ranging from -6V to -100V and can
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Active OR-ing of Redundant (N+1) Power
Supplies
withstand transients up to -100V.
The LM5051 also provides a FET test diagnostic
mode which allows the system controller to test for
shorted MOSFETs.
Typical Application Circuits
GND
LINE
GND
Shutdown
Status
OFF
nFGD
INN
LM5051
GATE
VCC
INP/VSS
+
LOAD
-
-V OUT
-48V
Figure 1. Full Application with MOSFET Diagnostic
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright ? 2011–2013, Texas Instruments Incorporated
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