参数资料
型号: MA17501
厂商: Dynex Semiconductor Ltd.
英文描述: Radiation Hard MIL-STD-1750A Execution unit
中文描述: 辐射硬的MIL - STD - 1750A执行单元
文件页数: 26/35页
文件大小: 431K
代理商: MA17501
MA17501
26/35
No.
Parameter
Test Conditions (1) (2)
Min (2)
Typ (2)
Max (2)
Units
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
OSC
to SYNCN
OSC
to SYSCLK1N
OSC
to SYNCLKN
OSC
to CLKPCN
OSC
to CLK02N
SYNCN
to AS
SYNCN
to AS
(4)
SYNCN
to DSN (Read)
SYNCN
to DSN
(Read) (3)
SYNCN
to DSN
(Write)
SYNCN
to DSN
(Write) (3)
SYNCN
to Address Valid
SYNCN
to Data Valid
SYNCN
to M/ION, RD/WN, IN/OPN, INTREN Valid
SYNCN
to HLDAKN Valid
SYSCLKN1
to T1 Valid
SYSCLKN1
to OVIN Valid
SYNCN
to AD Bus Hi-Z (Read) (6)
SYNCN
to AD Bus Active (Read)
PAUSEN
to AD Bus Hi-Z (Read) (6)
PAUSEN
to AD Bus Valid
PAUSEN
to AS, DSN, M/ION, RD/WN, IN/IOPN Hi-Z (6)
PAUSEN
to AS, DSN, M/ION, RD/WN, IN/IOPN Valid
HLDAKN
to AD Bus Hi-Z (Read) (6)
HLDAKN
to AD Bus Valid
HLDAKN
to AS, DSN, M/ION, RD/WN, IN/IOPN Hi-Z (6)
HLDAKN
to AS, DSN, M/ION, RD/WN, IN/IOPN Valid
Address after SYNCN
Data after SYNCN
M/ION, RD/WN, IN/OPN, INTREN after SYNCN
HLDAKN after SYNCN
T1N after SYSCLK1N
OVIN after SYSCLK1N
Data to SYNCN
Microcode to CLK02N
Microcode to SYSCLK1N
RDYN to OSC
IRDYN to OSC
Data after SYNCN
Microcode after CLK02N
Microcode after SYSCLK1N
RDYN after OSC
IRDYN after OSC
SYNCN to SYNCN
(7)
RESET
to RESET
(7)
RESET
to Related Outputs Valid (7)
PIFN to Related Outputs Valid
HOLDN to Related Outputs Valid (7)
DSN to Data Valid (Write) (7)
SYNCN to SYNCLKN (No.1 - No.3)
CLKPCN to SYNCLKN (No.4 - No.3)
SYSCLK1 to CLKPC (No.2 - No.4)
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 2
Load 2
Load 2
Load 2
Load 2, 3
Load 2, 3
Load 2
Load 2
Load 2, 3
Load 2, 3
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
10
40
40
40
40
40
1
τ
+5
2.5
τ
+15
3
τ
+20
30
3
τ
+22
4.5
τ
+10
68
3
τ
+45
70
20
75
100
3
τ
+50
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
1
τ
-10
2.5
τ
-10
3
τ
-5
10
3
τ
-5
4.5
τ
-5
15
70
60
50
59
60
50
30
30
3
τ
+15
12
5
-7
15
20
20
10
10
15
15
0
5
15
5
10
5
τ
-2
2
5
τ
+2
50
50
50
Load 3 (DSN) Load 2 (Data)
15
-5
-5
-5
8
5
10
MIL-STD-883, Method 5005, Subgroup 9, 10, 11
Notes:
1. T
= +25
°
C, -55
°
C and +125
°
C tested at VDD = 4.5V and 5.5V
2. r = 1OSC period 0.5r implies 50% OSC duty cycle
3. Add 1r for internal XlO; nr for memory wait
4. Excluding DMA and Hold conditions
5. Unless otherwise noted: V
ll
=
0.0V, V
IHTTL
4.0V, VIHOSC = 4.0V timing measured from 50% to 50% points
6. High impedance measured by 20% (of VDD) voltage change using 1K-ohm pullup resistor
7. Data obtained by characterisation or analysis, not routinely measured
8. Load 2 applies to bus interface signals AS, RD/W and IN/OP; Load 3 applies to bus interface signals M/ION and DSN
Table 4b: Timing Parameter Values
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