参数资料
型号: NCP3020ADR2G
厂商: ON Semiconductor
文件页数: 12/23页
文件大小: 0K
描述: IC REG CTRLR BUCK PWM VM 8-SOIC
标准包装: 1
PWM 型: 电压模式
输出数: 1
频率 - 最大: 360kHz
占空比: 84%
电源电压: 4.7 V ~ 28 V
降压:
升压:
回扫:
反相:
倍增器:
除法器:
Cuk:
隔离:
工作温度: -40°C ~ 125°C
封装/外壳: 8-SOIC(0.154",3.90mm 宽)
包装: 标准包装
其它名称: NCP3020ADR2GOSDKR
NCP3020A, NCP3020B, NCV3020A, NCV3020B
CURRENT LIMIT AND CURRENT LIMIT SET
Overview
The NCP3020 uses the voltage drop across the High Side
MOSFET during the on time to sense inductor current. The
I Limit block consists of a voltage comparator circuit which
compares the differential voltage across the V CC Pin and the
V SW Pin with a resistor settable voltage reference. The sense
portion of the circuit is only active while the HS MOSFET
is turned ON.
VI N
VCC
CONTROL
6
Ilim Out
DAC /
COUNTER
VSense
Itrip Ref
Switch
Cap
Iset
13 uA
Vset
HSDR
VSW
LSDR
RSet
Itrip Ref ? 63 Steps, 6.51 mV/step
Figure 26. I set / I Limit Block Diagram
Current Limit Set
The I Limit comparator reference is set during the startup
sequence by forcing a typically 13 m A current through the
low side gate drive resistor. The gate drive output will rise
to a voltage level shown in the equation below:
V set + I set * R set (eq. 1)
Where I SET is 13 m A and R SET is the gate to source resistor
on the low side MOSFET.
This resistor is normally installed to prevent MOSFET
leakage from causing unwanted turn on of the low side
MOSFET. In this case, the resistor is also used to set the
I Limit trip level reference through the I Limit DAC. The I set
process takes approximately 350 m s to complete prior to
Soft ? Start stepping. The scaled voltage level across the I SET
resistor is converted to a 6 bit digital value and stored as the
trip value. The binary I Limit value is scaled and converted to
the analog I Limit reference voltage through a DAC counter.
The DAC has 63 steps in 6.51 mV increments equating to a
maximum sense voltage of 403 mV. During the I set period
prior to Soft ? Start, the DAC counter increments the
reference on the I SET comparator until it crosses the V SET
voltage and holds the DAC reference output to that count
value. This voltage is translated to the I Limit comparator
during the I Sense portion of the switching cycle through the
switch cap circuit. See Figure 26. Exceeding the maximum
sense voltage results in no current limit. Steps 0 to 10 result
in an effective current limit of 0 mV.
Current Sense Cycle
Figure 27 shows how the current is sampled as it relates
to the switching cycle. Current level 1 in Figure 27
represents a condition that will not cause a fault. Current
level 2 represents a condition that will cause a fault. The
sense circuit is allowed to operate below the 3/4 point of a
given switching cycle. A given switching cycle’s 3/4 T on
time is defined by the prior cycle’s T on and is quantized in
10 ns steps. A fault occurs if the sensed MOSFET voltage
exceeds the DAC reference within the 3/4 time window of
the switching cycle.
http://onsemi.com
12
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