参数资料
型号: SCC68692E1N40,602
厂商: NXP Semiconductors
文件页数: 13/28页
文件大小: 0K
描述: IC DUART 40DIP
标准包装: 9
特点: 故障启动位检测
通道数: 2,DUART
FIFO's: 3 位
电源电压: 5V
带并行端口:
带自动流量控制功能:
带故障启动位检测功能:
带CMOS:
安装类型: 通孔
封装/外壳: 40-DIP(0.600",15.24mm)
供应商设备封装: 40-DIP
包装: 管件
其它名称: 935027050602
SCC68692E1N40
SCC68692E1N40-ND
Philips Semiconductors
Product data
SCC68692
Dual asynchronous receiver/transmitter (DUART)
2004 Mar 03
20
X1/CLK
INTRN
IACKN
D0–D7
DTACKN
tCSC
tDD
tDF
tCSD
tDAL
tDCR
tDAH
tDAT
NOTE: DACKN low requires two rising edges of X1 clock after CSN is low.
SD00149
Figure 6. Interrupt Cycle Timing
tPS
tPH
tPD
CSN
IP0–IP5
CSN
OP0–OP7
OLD DATA
NEW DATA
SD00150
Figure 7. Port Timing
NOTES:
1. INTRN or OP3 – OP7 when used as interrupt outputs.
2. The test for open-drain outputs is intended to guarantee switching of the output transistor. Measurement of this response is referenced from themidpoint of the switching signal, VM, to a
point 0.5V above VOL. This point represents noise margin that assures true switching has occurred. Beyond this level, the effects of external circuitry and test environment are pronounced
and can greatly affect the resultant measurement.
VM
VOL +0.5V
VOL
RDN
OR
WRN
INTERRUPT1
OUTPUT
tIR
SD00090
Figure 8. Interrupt Timing
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