参数资料
型号: SN65LVDS305ZQE
厂商: Texas Instruments, Inc.
英文描述: PROGRAMMABLE 27-BIT DISPLAY SERIAL INTERFACE TRANSMITTER
中文描述: 可编程27位显示器串行接口变送器
文件页数: 11/25页
文件大小: 586K
代理商: SN65LVDS305ZQE
www.ti.com
DEVICE ELECTRICAL CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
OUTPUT ELECTRICAL CHARACTERISTICS
over operating free-air temperature range (unless otherwise noted)
INPUT ELECTRICAL CHARACTERISTICS
over operating free-air temperature range (unless otherwise noted)
SN65LVDS305
SLLS744–AUGUST 2006
PARAMETER
TEST CONDITIONS
MIN
TYP
(1)
MAX
11.4
12.6
18.8
UNIT
f
PCLK
= 4 MHz
f
PCLK
= 6 MHz
f
PCLK
= 15 MHz
f
PCLK
= 4 MHz
f
PCLK
= 6 MHz
f
PCLK
= 15 MHz
V
= V
DDPLLA
= V
DDPLLD
= V
DDLVDS
L(PCLK)
R
L(D)
= V
DD
,
V
= 0 V, all inputs held
static high or static low
9
V
= V
DDPLLA
= V
DDPLLD
= V
DDLVDS
, R
L(PCLK)
= R
L(D)
=
100
, V
, V
DD
alternating 1010 serial bit pattern
10.6
16
mA
8
V
= V
DDPLLA
= V
DDPLLD
= V
DDLVDS
, R
L(PCLK)
= R
L(D)
=
100
, V
, V
DD
typical power test pattern (see
Table 4
)
8.9
14
0.61
mA
I
DD
Standby mode
10
μ
A
Shutdown mode
0.55
10
μ
A
(1)
All typical values are at 25
°
C and with 1.8 V supply unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN TYP
(1)
MAX
UNIT
subLVDS output (D+, D–, CLK+, and CLK–)
V
OC(SS)M
Steady-state common-mode output voltage
V
OCM(SS)
Change in steady-state common-mode output voltage
V
OCM(PP)
Peak-to-peak common mode output voltage
Differential output voltage magnitude
|V
OD
|
|V
Dx+
– V
Dx–
|, |V
CLK+
– V
CLK–
|
|V
OD
|
Change in differential output voltage between logic states
Z
OD(CLK)
Differential small-signal output impedance
I
OSD
Differential short-circuit output current
I
OS
Short circuit output current
(2)
High-impedance state output current
I
OZ
Output load; see
Figure 8
0.8
–10
0.9
1.0
10
75
V
mV
mV
100
150
200
mV
–10
10
mV
TXEN at V
DD
V
OD
= 0 V, f
PCLK
= 15 MHz
V
O
= 0 V or V
DD
V
= 0 V or V
DD
(max),
TXEN at GND
210
10
mA
5
–3
3
μ
A
(1)
(2)
All typical values are at 25
°
C and with 1.8-V supply unless otherwise noted.
All SN65LVDS305 outputs tolerate shorts to GND or V
DD
without permanent device damage.
PARAMETER
TEST CONDITIONS
MIN
TYP
(1)
MAX
UNIT
PCLK, R[0:7], G[0:7], B[0:7], VS, HS, DE, PCLK, CPOL, TXEN, SWAP
I
IH
High-level input current
I
IL
Low-level input current
C
IN
Input capacitance
V
IN
= 0.7 V
DD
V
IN
= 0.3 V
DD
–200
–200
200
200
nA
1.5
pF
(1)
All typical values are at 25
°
C and with 1.8-V supply unless otherwise noted.
11
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