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参数资料
型号： STM32F205RET6TR
厂商： STMICROELECTRONICS
元件分类： 微控制器/微处理器
英文描述： 32-BIT, FLASH, 120 MHz, RISC MICROCONTROLLER, PQFP64
封装： 10 X 10 MM, ROHS COMPLIANT, LQFP-64
文件页数： 152/163页
文件大小： 2275K
代理商： STM32F205RET6TR
STM32F205xx, STM32F207xx
Electrical characteristics
Doc ID 15818 Rev 7
89/163
These tests are compliant with EIA/JESD 78A IC latch-up standard.
5.3.15
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibilty to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into the
I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (>5
LSB TUE), out of spec current injection on adjacent pins or other functional failure (for
example reset, oscillator frequency deviation).
The test results are given in Table 40.
Table 39.
Electrical sensitivities
Symbol
Parameter
Conditions
Class
LU
Static latch-up class
TA = +105 °C conforming to JESD78A
II level A
Table 40.
I/O current injection susceptibility
Symbol
Description
Functional susceptibility
Unit
Negative
injection
Positive
injection
IINJ
Injected current on all FT pins
–5
+0
mA
Injected current on any other pin
–5
+5
相关PDF资料
PDF描述
STM32F205RET6XXX 32-BIT, FLASH, 120 MHz, RISC MICROCONTROLLER, PQFP64
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相关代理商/技术参数
参数描述
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