参数资料
型号: SUD50N04-05L-E3
厂商: Vishay Siliconix
文件页数: 2/5页
文件大小: 0K
描述: MOSFET N-CH D-S 40V TO252
标准包装: 2,000
系列: TrenchFET®
FET 型: MOSFET N 通道,金属氧化物
FET 特点: 逻辑电平门
漏极至源极电压(Vdss): 40V
电流 - 连续漏极(Id) @ 25° C: 115A
开态Rds(最大)@ Id, Vgs @ 25° C: 5.4 毫欧 @ 20A,10V
Id 时的 Vgs(th)(最大): 3V @ 250µA
闸电荷(Qg) @ Vgs: 135nC @ 10V
输入电容 (Ciss) @ Vds: 5600pF @ 25V
功率 - 最大: 136W
安装类型: 表面贴装
封装/外壳: TO-252-3,DPak(2 引线+接片),SC-63
供应商设备封装: TO-252,(D-Pak)
包装: 带卷 (TR)
New Product
SUD50N04-05L
Vishay Siliconix
SPECIFICATIONS T J = 25 °C, unless otherwise noted
Parameter
Symbol
Test Conditions
Min
Typ
Max
Unit
Static
Drain-Source Breakdown Voltage
Gate Threshold Voltage
Gate-Body Leakage
V (BR)DSS
V GS(th)
I GSS
V GS = 0 V, I D = 250 μA
V DS = V GS , I D = 250 μA
V DS = 0 V, V GS = ± 20 V
40
1
3
± 100
V
nA
V DS = 40 V, V GS = 0 V
1
Zero Gate Voltage Drain Current
I DSS
V DS = 40 V, V GS = 0 V, T J = 125 °C
50
μA
V DS = 40 V, V GS = 0 V, T J = 175 °C
150
On-State Drain Current a
I D(on)
V DS = 5 V, V GS = 10 V
V GS = 10 V, I D = 20 A
50
0.0044
0.0054
A
Drain-Source On-State Resistance a
r DS(on)
V GS = 10 V, I D = 20 A, T J = 125 °C
V GS = 10 V, I D = 20 A, T J = 175 °C
V GS = 4.5 V, I D = 20 A
0.0055
0.0083
0.0130
0.0069
Ω
Forward Transconductance
a
g fs
V DS = 15 V, I D = 15 A
20
80
S
Dynamic b
Input Capacitance
C iss
5600
Gate-Source Charge
Gate-Drain Charge
Output Capacitance
Reversen Transfer Capacitance
Total Gate Charge c
c
c
Gate Resistance
C oss
C rss
Q g
Q gs
Q gd
R g
V GS = 0 V, V DS = 25 V, f = 1 MHz
V DS = 20 V, V GS = 10 V, I D = 50 A
590
365
90
19
19
1.6
135
pF
nC
Ω
Turn-On Delay Time
c
t d(on)
15
25
Rise Time
c
Turn-Off Delay Time
c
t r
t d(off)
V DD = 20 V, R L = 0.4 Ω
I D ? 50 A, V GEN = 10 V, R g = 2.5 Ω
20
65
30
100
ns
Fall Time c
t f
11
20
Source-Drain Diode Ratings and Characteristics (T C = 25
°C) b
Continuous Current
Pulsed Current
I S
I SM
50
100
A
Forward Voltage a
Reverse Recovery Time
V SD
t rr
I F = 30 A, V GS = 0 V
I F = 30 A, di/dt = 100 A/μs
0.90
30
1.50
45
V
ns
Notes:
a. Pulse test; pulse width ≤ 300 μs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
c. Independent of operating temperature.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
www.vishay.com
2
Document Number: 72786
S-71661-Rev. B, 06-Aug-07
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