参数资料
型号: SUD50P04-13L-E3
厂商: Vishay Siliconix
文件页数: 2/6页
文件大小: 0K
描述: MOSFET P-CH D-S 40V TO252
标准包装: 2,000
系列: TrenchFET®
FET 型: MOSFET P 通道,金属氧化物
FET 特点: 逻辑电平门
漏极至源极电压(Vdss): 40V
电流 - 连续漏极(Id) @ 25° C: 60A
开态Rds(最大)@ Id, Vgs @ 25° C: 13 毫欧 @ 30A,10V
Id 时的 Vgs(th)(最大): 3V @ 250µA
闸电荷(Qg) @ Vgs: 95nC @ 10V
输入电容 (Ciss) @ Vds: 3120pF @ 25V
功率 - 最大: 3W
安装类型: 表面贴装
封装/外壳: TO-252-3,DPak(2 引线+接片),SC-63
供应商设备封装: TO-252,(D-Pak)
包装: 带卷 (TR)
New Product
SUD50P04-13L
Vishay Siliconix
SPECIFICATIONS T J = 25 °C, unless otherwise noted
Parameter
Symbol
Test Conditions
Min
Typ
Max
Unit
Static
Drain-Source Breakdown Voltage
Gate-Source Threshold Voltage
V (BR)DSS
V GS(th)
V GS = 0 V, I D = - 250 μA
V DS = V GS , I D = - 250 μA
- 40
- 1.0
- 3.0
V
Gate-Source Leakage
Zero Gate Voltage Drain Current
On-State Drain Current a
Drain-Source On-State Resistance a
Forward Transconductance a
I GSS
I DSS
I D(on)
r DS(on)
g fs
V DS = 0 V, V GS = ± 20 V
V DS = - 40 V, V GS = 0 V
V DS = - 40 V, V GS = 0 V, T J = 125 °C
V DS = - 5 V, V GS = - 10 V
V GS = - 10 V, I D = - 30 A
V GS = - 10 V, I D = - 30 A, T J = 125 °C
V GS = - 4.5 V, I D = - 20 A
V DS = - 15 V, I D = - 30 A
- 50
15
0.0105
0.017
± 100
-1
- 50
0.013
0.020
0.022
nA
μA
A
Ω
S
Dynamic b
Input Capacitance
C iss
3120
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
C oss
C rss
R g
V DS = - 25 V, V GS = 0 V, f = 1 MHz
f = 1 MHz
440
320
4.3
pF
Ω
Total Gate Charge
c
Q g
63
95
Gate-Drain Charge
Gate-Source Charge c
c
Turn-On Delay Time c
Q gs
Q gd
t d(on)
V DS = - 20 V, V GS = - 10 V, I D = - 50 A
13
16
15
25
nC
Rise Time c
Turn-Off Delay Time c
Fall Time c
t r
t d(off)
t f
V DD = - 20 V, R L = 0.4 Ω
I D ? - 50 A, V GEN = - 10 V, R g = 2.5 Ω
18
60
47
30
90
70
ns
Drain-Source Body Diode Characteristics
Pulse Current
I SM
- 100
Forward Voltage
a
V SD
I F = - 50 A, V GS = 0 V
- 1.0
- 1.5
V
Source-Drain Reverse Recovery Time
t rr
I F = - 50 A, di/dT = 100 A/μs
36
55
ns
Notes:
a. Pulse test; pulse width ≤ 300 μs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
c. Independent of operating temperature.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
www.vishay.com
2
Document Number: 73009
S-71660-Rev. B, 06-Aug-07
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