参数资料
型号: ZPSD412A0-C-90UI
元件分类: 微控制器/微处理器
英文描述: 64K X 8 OTPROM, 40 I/O, PIA-GENERAL PURPOSE, PQFP80
封装: PLASTIC, TQFP-80
文件页数: 9/128页
文件大小: 433K
代理商: ZPSD412A0-C-90UI
PSD4XX Family
102
Symbol
Parameter 14
Conditions Typical15 Max
Unit
CIN
Capacitance (for input pins only)
VIN = 0 V
4
6
pF
COUT
Capacitance (for input/output pins)
VOUT = 0 V
8
12
pF
CVPP
Capacitance (for WR/VPP or R/W/VPP)VPP = 0 V
18
25
pF
NOTES: 14. These parameters are only sampled and are not 100% tested.
15. Typical values are for TA = 25°C and nominal supply voltages.
TA = 25 °C, f = 1 MHz
15.0
Pin Capacitance
16.0
AC Testing
Figure 51. AC Testing Load Circuit
17.0
Erasure and
Programming
3.0V
0V
TEST POINT
1.5V
DEVICE
UNDER TEST
2.01 V
195
C
L = 30 pF
(INCLUDING
SCOPE AND JIG
CAPACITANCE)
To clear all locations of their programmed contents, expose the window packaged device
to an ultra-violet light source. A dosage of 30 W second/cm2 is required (40 W second/cm2
for ZPSD4XXV versions). This dosage can be obtained with exposure to a wavelength of
2537 and intensity of 12000 W/cm2 for 40 to 45 minutes (55 to 60 minutes for
ZPSD4XXV versions). The device should be about 1 inch from the source, and all filters
should be removed from the UV light source prior to erasure.
The PSD4XX and similar devices will erase with light sources having wavelengths shorter
than 4000 . Although the erasure times will be much longer than with UV sources at 2537
, exposure to fluorescent light and sunlight eventually erases the device. For maximum
system reliability, these sources should be avoided. If used in such an environment, the
package windows should be covered by an opaque substance.
Upon delivery from WSI, or after each erasure, the PSD4XX device has all bits in the PAD
and EPROM in the “1” or high state. The configuration bits are in the “0” or low state. The
code, configuration, and PAD MAP data are loaded through the procedure of programming
Information for programming the device is available directly from WSI. Please contact your
local sales representative.
Figure 50. AC Testing Input/Output Waveform
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