参数资料
型号: AD6623ABC
厂商: ANALOG DEVICES INC
元件分类: 通信及网络
英文描述: 4-Channel, 104 MSPS Digital Transmit Signal Processor TSP
中文描述: SPECIALTY TELECOM CIRCUIT, PBGA196
封装: CSPBGA-196
文件页数: 28/40页
文件大小: 381K
代理商: AD6623ABC
REV. 0
AD6623
–28–
Beam
A change in phase for a particular channel and can be synchronized
with respect to other channels or AD6623s. This change in phase
can be synchronized via microprocessor control or an external
Sync signal.
To set the amplitude without synchronization the following
method should be used.
Set Phase No Beam
1. Set the NCO Phase Offset Update Hold-Off Counter (0xn05)
to 0.
2. Load the appropriate NCO Phase Offset (0xn04). The NCO
Phase Offset will be immediately loaded.
Beam with Soft Sync
The AD6623 includes the ability to synchronize a change in NCO
phase of multiple channels or chips under microprocessor control.
The NCO Phase Offset Update Hold-Off Counter in conjunction
with the Beam bit and the Sync bit (Ext Address 5) allow this
synchronization. Basically the NCO Phase Offset Update Hold-
Off Counter delays the new phase from being loaded into the
NCO/RCF by its value (number of AD6623 CLKs). The following
method is used to synchronize a beam in phase of multiple channels
via microprocessor control.
1. Write the NCO Phase Offset Update Hold-Off Counter (0xn05)
to the appropriate value (greater than 1 and less then 2
16
1).
2. Write the NCO Phase Offset register(s) to the new desired
phase and amplitude.
3. Write the beam bit and the Sync(s) bit high (Ext Address 5).
4. This starts the NCO Phase Offset Update Hold-Off Counter
counting down. The counter is clocked with the AD6623
CLK signal. When it reaches a count of one the new phase is
loaded into the NCO.
Beam with Pin Sync
A Sync pin is provided on the AD6623 to provide the most
accurate synchronization, especially between multiple AD6623s.
Synchronization of beaming to a new NCO Phase Offset with an
external signal is accomplished using the following method.
1. Write the NCO Phase Offset Hold-Off (0xn05) counter(s) to
the appropriate value (greater than 1 and less than 2
16
1).
2. Write the NCO Phase Offset register(s) to the new desired
phase and amplitude.
3. Set the Beam on Pin Sync bit and the appropriate Sync Pin
Enable high (0xn01).
4. When the Sync pin is sampled high by the AD6623 CLK this
enables the count down of the NCO Phase Offset Hold-Off
counter. The counter is clocked with the AD6623 CLK signal.
When it reaches a count of one the new phase is loaded into
the NCO registers.
JTAG INTERFACE
The AD6623 supports a subset of IEEE Standard 1149.1 specifica-
tion. For additional details of the standard, please see
IEEE Standard
Test Access Port and Boundary-Scan Architecture
, IEEE-1149
publication from IEEE.
The AD6623 has five pins associated with the JTAG interface.
These pins are used to access the on-chip Test Access Port and
are listed in Table XVII.
Table XVII. Test Access Port Pins
Name
Pin Number
Description
TRST
TCK
TMS
TDI
TDO
100
101
106
108
107
Test Access Port Reset
Test Clock
Test Access Port Mode Select
Test Data Input
Test Data Output
Note that TCK and TDI are internally pulled down which is
opposite of IEEE Standard 1149.1. These pins may be connected
to external pull-up resistors, with the associated additional current
draw through the pull-ups, or left unconnected.
The AD6623 supports four op codes are shown in Table XVIII.
These instructions set the mode of the JTAG interface.
Table XVIII. Op Codes
Instruction
Op Code
IDCODE
BYPASS
SAMPLE/PRELOAD
EXTEST
10
11
01
00
The Vendor Identification Code (Table XIX) can be accessed
through the IDCODE instruction and has the following format.
Table XIX. Vendor Identification Code
MSB
Version Number
Part
Manufacturer
ID Number
LSB
Mandatory
0000
0010 0111 1000 0000
000 1110 0101
1
A BSDL file for this device is available from Analog Devices, Inc.
Contact Analog Devices for more information.
SCALING
Proper scaling of the wideband output is critical to maximize the
spurious and noise performance of the AD6623. A relatively small
overflow anywhere in the data path can cause the spurious free
dynamic range to drop precipitously. Scaling down the output
levels also reduces dynamic range relative to an approximately
constant noise floor. A well-balanced scaling plan at each point
in the signal path will be rewarded with optimum performance.
The scaling plan can be separated into two parts: multicarrier
scaling and single-carrier scaling.
Multicarrier Scaling
An arbitrary number of AD6623s can be cascaded to create a
composite digital IF with many carriers. As the number of carriers
increases, the peak to RMS ratio of the composite digital IF will
increase as well. It is possible and beneficial to limit the peak to
RMS ratio through careful frequency planning and controlled
phase offsets. Nevertheless, in most cases with a
large number of
carriers, the worst-case peak is an unlikely event.
The AD6623 immediately preceding the DAC can be programmed
to clip rather than wrap around (see the Summation Block de-
scription). For a large number of carriers, a rare but finite chance of
clipping at the AD6623 wideband output will result in superior
dynamic range compared to lowering each carrier level until
clipping is impossible. This will also be the case for most DACs.
Through analysis or experimentation, an optimal output level of
individual carriers can be determined for any particular DAC.
相关PDF资料
PDF描述
AD6623AS 4-Channel, 104 MSPS Digital Transmit Signal Processor TSP
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