参数资料
| 型号： | ADUC836BCPZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 21/80页 |
| 文件大小： | 0K |
| 描述： | IC MCU 62K FLASH ADC/DAC 56LFCSP |
| 标准包装： | 1 |
| 系列： | MicroConverter® ADuC8xx |
| 核心处理器： | 8052 |
| 芯体尺寸： | 8-位 |
| 速度： | 12.58MHz |
| 连通性： | EBI/EMI，I²C，SPI，UART/USART |
| 外围设备： | POR，PSM，PWM，温度传感器，WDT |
| 输入/输出数： | 34 |
| 程序存储器容量： | 62KB（62K x 8） |
| 程序存储器类型： | 闪存 |
| EEPROM 大小： | 4K x 8 |
| RAM 容量： | 2.25K x 8 |
| 电压 - 电源 (Vcc/Vdd)： | 2.7 V ~ 5.25 V |
| 数据转换器： | A/D 7x16b; D/A 1x12b |
| 振荡器型： | 内部 |
| 工作温度： | -40°C ~ 85°C |
| 封装/外壳： | 56-VFQFN 裸露焊盘，CSP |
| 包装： | 托盘 |
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ADuC836
–28–
ADuC836
–29–
ADC Chopping
Both ADCs on the ADuC836 implement a chopping scheme
whereby the ADC repeatedly reverses its inputs.The decimated
digital output words from the Sinc3 filters therefore have a positive
offset and negative offset term included.
As a result, a final summing stage is included in each ADC so that
each output word from the filter is summed and averaged with
the previous filter output to produce a new valid output result
to be written to the ADC data SFRs. In this way, while the ADC
throughput or update rate is as discussed earlier and illustrated in
Table VIII, the full settling time through the ADC (or the time to
a first conversion result) will actually be given by 2 tADC.
The chopping scheme incorporated in the ADuC836 ADC results
in excellent dc offset and offset drift specifications and is extremely
beneficial in applications where drift, noise rejection, and optimum
EMI rejection are important factors.
Calibration
The ADuC836 provides four calibration modes that can be pro-
grammed via the mode bits in the ADCMODE SFR detailed in
Table V. In fact, every ADuC836 has already been factory cali-
brated.The resultant Offset and Gain calibration coefficients
for both the primary and auxiliary ADCs are stored on-chip in
manufacturing-specific Flash/EE memory locations. At power-on
or after reset, these factory calibration coefficients are automati-
cally downloaded to the calibration registers in the ADuC836
SFR space. Each ADC (primary and auxiliary) has dedicated
calibration SFRs, which have been described earlier as part of the
general ADC SFR description. However, the factory calibration
values in the ADC calibration SFRs will be overwritten if any
one of the four calibration options are initiated and that ADC is
enabled via the ADC enable bits in ADCMODE.
Even though an internal offset calibration mode is described
below, it should be recognized that both ADCs are chopped.This
chopping scheme inherently minimizes offset and means that an
internal offset calibration should never be required. Also, because
factory 5 V/25°C gain calibration coefficients are automatically
present at power-on an internal full-scale calibration will only be
required if the part is being operated at 3 V or at temperatures
significantly different from 25°C.
The ADuC836 offers internal or system calibration facilities. For
full calibration to occur on the selected ADC, the calibration
logic must record the modulator output for two different input
conditions: zero-scale and full-scale points.These points are
derived by performing a conversion on the different input volt-
ages provided to the input of the modulator during calibration.
The result of the zero-scale calibration conversion is stored in the
Offset Calibration Registers for the appropriate ADC.The result
of the full-scale calibration conversion is stored in the Gain Cali-
bration Registers for the appropriate ADC.With these readings,
the calibration logic can calculate the offset and the gain slope for
the input-to-output transfer function of the converter.
During an internal zero-scale or full-scale calibration, the respective
zero-scale input and full-scale inputs are automatically connected to
the ADC input pins internally to the device. A system calibration,
however, expects the system zero-scale and system full-scale volt-
ages to be applied to the external ADC pins before the calibration
mode is initiated. In this way, external ADC errors are taken into
account and minimized as a result of system calibration. It should
also be noted that to optimize calibration accuracy, all ADuC836
ADC calibrations are carried out automatically at the slowest
update rate.
Internally in the ADuC836, the coefficients are normalized before
being used to scale the words coming out of the digital filter.The
offset calibration coefficient is subtracted from the result prior to
the multiplication by the gain coefficient.
From an operational point of view, a calibration should be treated
like another ADC conversion. A zero-scale calibration (if required)
should always be carried out before a full-scale calibration. System
software should monitor the relevant ADC RDY0/1 bit in the
ADCSTAT SFR to determine end of calibration via a polling
sequence or interrupt driven routine.
REV. A
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相关代理商/技术参数 |
参数描述 |
|---|---|
| ADUC836BCPZ-REEL | 功能描述:IC MCU 62K FLASH ADC/DAC 56LFCSP RoHS:是 类别:集成电路 (IC) >> 嵌入式 - 微控制器， 系列:MicroConverter® ADuC8xx 标准包装:38 系列:Encore!® XP® 核心处理器:eZ8 芯体尺寸:8-位 速度:5MHz 连通性:IrDA，UART/USART 外围设备:欠压检测/复位，LED，POR，PWM，WDT 输入/输出数:16 程序存储器容量:4KB（4K x 8） 程序存储器类型:闪存 EEPROM 大小:- RAM 容量:1K x 8 电压 - 电源 (Vcc/Vdd):2.7 V ~ 3.6 V 数据转换器:- 振荡器型:内部 工作温度:-40°C ~ 105°C 封装/外壳:20-SOIC（0.295"，7.50mm 宽） 包装:管件 其它名称:269-4116Z8F0413SH005EG-ND |
| ADUC836BS | 制造商:Analog Devices 功能描述:MCU 8-bit ADuC8xx 8052 CISC 62KB Flash 3.3V/5V 52-Pin MQFP 制造商:Analog Devices 功能描述:8BIT MCU +16BIT DUAL ADC MQFP52 |
| ADUC836BS | 制造商:Analog Devices 功能描述:IC SEMICONDUCTOR ((NS)) |
| ADUC836BSZ | 功能描述:IC ADC DUAL 16BIT W/MCU 52-MQFP RoHS:是 类别:集成电路 (IC) >> 嵌入式 - 微控制器， 系列:MicroConverter® ADuC8xx 标准包装:250 系列:56F8xxx 核心处理器:56800E 芯体尺寸:16-位 速度:60MHz 连通性:CAN，SCI，SPI 外围设备:POR，PWM，温度传感器，WDT 输入/输出数:21 程序存储器容量:40KB（20K x 16） 程序存储器类型:闪存 EEPROM 大小:- RAM 容量:6K x 16 电压 - 电源 (Vcc/Vdd):2.25 V ~ 3.6 V 数据转换器:A/D 6x12b 振荡器型:内部 工作温度:-40°C ~ 125°C 封装/外壳:48-LQFP 包装:托盘 配用:MC56F8323EVME-ND - BOARD EVALUATION MC56F8323 |
| ADUC841 | 制造商:AD 制造商全称:Analog Devices 功能描述:MicroConverter 12-Bit ADCs and DACs with Embedded High Speed 62-kB Flash MCU |
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