参数资料
型号: AS7C25512FT32A-85BIN
厂商: ALLIANCE SEMICONDUCTOR CORP
元件分类: SRAM
英文描述: 512K X 32 STANDARD SRAM, 8.5 ns, PBGA165
封装: LEAD FREE, BGA-165
文件页数: 19/24页
文件大小: 574K
代理商: AS7C25512FT32A-85BIN
AS7C25512FT32A
AS7C25512FT36A
4/12/04, v. 1.0
Alliance Semiconductor
4 of 24
Functional description
The AS7C25512FT32A/36A is a high-performance CMOS 16-Mbit synchronous Static Random Access Memory (SRAM) device organized
as 524,288 words x 32/36.
Fast cycle times of 10/12 ns with clock access times (tCD) of 8.5/10.0 ns. Three chip enable (CE) inputs permit easy memory expansion.
Burst operation is initiated in one of two ways: the controller address strobe (ADSC), or the processor address strobe (ADSP). The burst
advance pin (ADV) allows subsequent internally generated burst addresses.
Read cycles are initiated with ADSP (regardless of WE and ADSC) using the new external address clocked into the on-chip address register
when ADSP is sampled LOW, the chip enables are sampled active, and the output buffer is enabled with OE. In a read operation, the data
accessed by the current address registered in the address registers by the positive edge of CLK are carried to the data-out buffer. ADV is
ignored on the clock edge that samples ADSP asserted, but is sampled on all subsequent clock edges. Address is incremented internally for
the next access of the burst when ADV is sampled LOW and both address strobes are HIGH. Burst mode is selectable with the LBO input.
With LBO unconnected or driven HIGH, burst operations use an interleaved count sequence. With LBO driven LOW, the device uses a linear
count sequence.
Write cycles are performed by disabling the output buffers with OE and asserting a write command. A global write enable GWE writes all 32/
36 regardless of the state of individual BW[a:d] inputs. Alternately, when GWE is HIGH, one or more bytes may be written by asserting
BWE and the appropriate individual byte BWn signals.
BWn is ignored on the clock edge that samples ADSP LOW, but it is sampled on all subsequent clock edges. Output buffers are disabled
when BWn is sampled LOW regardless of OE. Data is clocked into the data input register when BWn is sampled LOW. Address is
incremented internally to the next burst address if BWn and ADV are sampled LOW.
Read or write cycles may also be initiated with ADSC instead of ADSP. The differences between cycles initiated with ADSC and ADSP
follow.
ADSP must be sampled HIGH when ADSC is sampled LOW to initiate a cycle with ADSC.
WE signals are sampled on the clock edge that samples ADSC LOW (and ADSP HIGH).
Master chip enable CE0 blocks ADSP, but not ADSC.
The AS7C25512FT32A/36A family operates from a core 2.5V power supply. These devices are available in a 100-pin TQFP and 165-ball
BGA.
TQFP and BGA capacitance
TQFP and BGA thermal resistance
Parameter
Symbol
Test conditions
Min
Max
Unit
Input capacitance
CIN
VIN = 0V
-
5
pF
I/O capacitance
CI/O
VOUT = 0V
-
7
pF
Description
Conditions
Symbol
Typical
Units
Thermal resistance
(junction to ambient)1
1 This parameter is sampled
Test conditions follow standard test
methods and procedures for measuring
thermal impedance, per EIA/JESD51
1–layer
θJA
40
°C/W
4–layer
θJA
22
°C/W
Thermal resistance
(junction to top of case)1
θJC
8
°C/W
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相关代理商/技术参数
参数描述
AS7C25512FT32A-85TQC 制造商:ALSC 制造商全称:Alliance Semiconductor Corporation 功能描述:2.5V 512K x 32/36 flowthrough burst synchronous SRAM
AS7C25512FT32A-85TQCN 制造商:ALSC 制造商全称:Alliance Semiconductor Corporation 功能描述:2.5V 512K x 32/36 flowthrough burst synchronous SRAM
AS7C25512FT32A-85TQI 制造商:ALSC 制造商全称:Alliance Semiconductor Corporation 功能描述:2.5V 512K x 32/36 flowthrough burst synchronous SRAM
AS7C25512FT32A-85TQIN 制造商:ALSC 制造商全称:Alliance Semiconductor Corporation 功能描述:2.5V 512K x 32/36 flowthrough burst synchronous SRAM
AS7C25512FT36A-10TQC 制造商:ALSC 制造商全称:Alliance Semiconductor Corporation 功能描述:2.5V 512K x 32/36 flowthrough burst synchronous SRAM