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参数资料
| 型号： | HFA3860AIV |
| 厂商： | INTERSIL CORP |
| 元件分类： | 无绳电话/电话 |
| 英文描述： | 3.3V 288-mc CPLD |
| 中文描述： | TELECOM, CELLULAR, BASEBAND CIRCUIT, PQFP48 |
| 封装： | 7 X 7 X 1 MM, PLASTIC, TQFP-48 |
| 文件页数： | 32/39页 |
| 文件大小： | 251K |
| 代理商： | HFA3860AIV |
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2-162
Bits 7:0
Test Bus Address = 07h
Freq Test Lo Rate
Test 7:0 = Freq Reg Lo Rate (18:11)
TEST_CLK = SUBSAMPLECLK (Symbol Clock)
Bits 7:0
Test Bus Address = 08h
Phase Test Lo Rate
Test 7:0 = Phase Reg Lo Rate (7:0)
TEST_CLK = SUBSAMPLECLK (Symbol Clock)
Bits 7:0
Test Bus Address = 09h
NCO Test Lo Rate
Test 7:0 = NCO Reg Lo Rate (15:8)
TEST_CLK = SUBSAMPLECLK (Symbol Clock)
Bits 7:0
Test Bus Address = 0Ah
Bit Sync Accum Lo Rate
Test 7:0 = Bit Sync Accumulator (7:3), exponent (2:0)
TEST_CLK = Last symbol indicator
Bits 7:0
Test Bus Address = 0Bh
Test PN Gen.,
Factory Test Only
Test 7:0 +TEST_CLK = Top 9 bits of PN generator used for fault tests.
Bits 7:0
Test Bus Address = 0Ch
A/D Cal Test Mode
Test 7 = A/D CAL (Full Scale)
Test 6 = ED, Energy Detect Comparator Output
Test 5 = A/D_CAL Disable
Test(4:0) = A/D_Cal(4:0)
TEST_CLK = A/D_Cal CLK
Bits 7:0
Test Bus Address = 0Dh
Correlator I High Rate,
tests the MBOK I correlator output.
Test 7:0 = Correlator I Hi Rate (8:1)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 0Eh
Correlator Q High Rate,
tests the MBOK Q correlator output.
Test 7:0 = Correlator Q Hi Rate (8:1)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 0Fh
Chip Error Accumulator,
Test 7:0 = Chip Error Accumulator (14:7)
TEST_CLK = 0
Bits 7:0
Test Bus Address = 10h
NCO Test Hi Rate,
tests the NCO in the high rate tracking section.
Test 7:0 = NCO Accum (19:12)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 11h
FREQ Test Hi Rate,
tests the NCO lag accumulator in the high rate tracking section.
Test 7:0 = Lag Accum (18:11)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 12h
Carrier Phase Error Hi Rate
Test 7:0 = Carrier Phase Error (6,6:0)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 13h
I_ROT Hi Rate,
tests the I Channel phase rotation error signal.
Test 7:0 = I_ROT (5,5,5:0)
TEST_CLK = Sample CLK
CONFIGURATION REGISTER 28 ADDRESS (70h) TEST BUS ADDRESS (Continued)
Supplies address for test pin outputs and Test Bus Monitor Register
HFA3860A
相关PDF资料 |
PDF描述 |
|---|---|
| HFA3861AIN96 | Circular Connector; No. of Contacts:21; Series:MS27473; Body Material:Aluminum; Connecting Termination:Crimp; Connector Shell Size:22; Circular Contact Gender:Socket; Circular Shell Style:Straight Plug; Insert Arrangement:22-21 RoHS Compliant: No |
| HFA3861AIN | 288 MACROCELL 3.3 VOLT ISP CPLD |
| HFA3863IN | Direct Sequence Spread Spectrum Baseband Processor |
| HFA3863IN96 | Direct Sequence Spread Spectrum Baseband Processor |
| HFA3863 | Direct Sequence Spread Spectrum Baseband Processor(直接序列扩谱基带处理器) |
相关代理商/技术参数 |
参数描述 |
|---|---|
| HFA3860AIV WAF | 制造商:Harris Corporation 功能描述: |
| HFA3860AIV96 | 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:Direct Sequence Spread Spectrum Baseband |
| HFA3860B | 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:nullDirect Sequence Spread Spectrum Baseband Processor |
| HFA3860BIV | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| HFA3860BIV WAF | 制造商:Harris Corporation 功能描述: |
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