IBM0116165
IBM0116165B
1M x 16 12/8 EDO DRAM
IBM0116165M
IBM0116165P
IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 30 of 31
28H4723
SA14-4225-06
Revised 4/97
Revision Log
Revision
Contents Of Modification
11/15/95
Initial Release
12/10/95
1. The Low Power and Standard Power Specifications were combined. ES# 28H4722 and ES# 28H4723 were
combined into ES# 28H4723.
2. Added Die Rev E part numbers.
3. A -6R speed sort was added, with the following differences over the -60 speed sort:
-
t
CAC
was increased from 15ns to 17ns for the -6R speed sort
-
t
RCD
(max) was decreased from 45ns to 43ns for the -6R speed sort.
-
t
CWD
was increased from 34ns to 36ns for the -6R speed sort.
-
t
OEA
was increased from 15ns to 17ns for the -6R speed sort.
4. t
CHD
was added to the Self Refresh Cycle with a value of 350
μ
s for all speed sorts.
5. The Self Refresh timing diagram was changed to allow CAS to go high t
CHD
(350
μ
s) after RAS falls entering a
Self Refresh.
6. The CBR timing diagram was changed to allow CAS to remain low for back-to-back CBR cycles.
7. WE for the Hidden Refresh Write cycle in the Truth Table was changed from “L” to ” H”.
09/01/96
1. I
CC2
was changed from 2mA to 1mA.
2. I
I(L)
and I
O(L)
were altered from +/- 10uA to +/- 5uA.
3. t
RC
was changed from 89ns to 84ns for the -50 speed sort.
4. t
CSH
changed from 45ns to 38ns, 50ns to 45ns, and 55ns to 50ns for the -50, -60, and -70 speed sorts, respec-
tively.
5. t
T
was initially at a max of 30ns. It has been modified to 50ns for all speed sorts.
6. t
CPA
was decreased from 30ns to 28ns for the -50 speed sort.
7. t
RASP
max of 125K was raised to 200K for all speed sorts.
8. t
OEP
was changed from 10ns to 5ns for all speed sorts.
9. t
OEHC
was also lowered from 10ns to 5ns for all speed sorts.
10. t
RP
was changed from 35ns to 30ns for the -50 speed sort.
03/19/97
1. WE for the Hidden Refresh Write cycle in the Truth Table was changed from “H” to “L
→
H”.
2. t
OED
was moved from the Common Parameters table to the Write Cycle Parameters Table.
3. t
RWC
for the -50 part was changed from 115ns to 100ns.
4. The note “Implementing WE at RAS time during a Read or Write cycle is optional. Doing so will facilitate com-
patibility with future EDO DRAMs.” was removed from all of the Read and Write timing diagrams.
5. t
ODD
in the CAS before RAS timing diagram was renamed t
OED
.
6. The -70 and -6R speed sorts and timings were removed.
7. I
cc1
, I
cc3
, I
cc6
for the -50 speed sort were reduced from 85mA to 55mA.
8. I
cc4
for the -50 speed sort was reduced from 75mA to 35mA.
9. I
cc1
, I
cc3
, I
cc6
for the -60 speed sort were reduced from 75mA to 50mA.
10. I
cc4
for the -60 speed sort was reduced from 65mA to 30mA.
04/23/97
1. I
cc5
was changed from 200
μ
A to 100
μ
A for the Low Power Die Rev F Parts.
Discontinued (9/98 - last order; 3/99 last ship)