参数资料
型号: M29F400FB55M3F2
元件分类: PROM
英文描述: 256K X 16 FLASH 5V PROM, 55 ns, PDSO44
封装: 0.500 INCH, ROHS COMPLIANT, PLASTIC, SOP-44
文件页数: 25/65页
文件大小: 1669K
代理商: M29F400FB55M3F2
M29FxxxFT, M29FxxxFB
Command Interface
31/65
Table 6.
Program/Erase Times and Program/Erase Endurance Cycles, M29F160F
Typical values are measured at room temperature and nominal voltages; typical and maximum values are samples, not 100%
tested.
Chip Erase, Program, and Chip Program parameters: Maximum value measured at worst case conditions for both temperature
and VCC after 100,000 program/erase cycles.
Block Erase and Erase Suspend Latency parameters: Maximum value measured at worst case conditions for both temperature
and VCC.
Table 7.
Program/Erase Times and Program/Erase Endurance Cycles, M29F800F
Typical values are measured at room temperature and nominal voltages; typical and maximum values are samples, not 100%
tested.
Chip Erase, Program, and Chip Program parameters: Maximum value measured at worst case conditions for both temperature
and VCC after 100,000 program/erase cycles.
Block Erase and Erase Suspend Latency parameter: Maximum value measured at worst case conditions for both temperature
and VCC.
Parameter
Min
Typical
Max
Unit
Chip Erase
25
120
s
Block Erase (64 KBytes)
0.8
6
s
Erase Suspend Latency Time
20
25
μs
Program (Byte or Word)
11
200
μs
Chip Program (Byte by Byte)
24
120
s
Chip Program (Word by Word)
12
60
s
Program/Erase Cycles (per Block)
100,000
cycles
Data Retention
20
years
Parameter
Min
Typical
Max
Unit
Chip Erase
12
60
s
Block Erase (64 KBytes)
0.8
6
s
Erase Suspend Latency Time
20
25
μs
Program (Byte or Word)
11
200
μs
Chip Program (Byte by Byte)
12
s
Chip Program (Word by Word)
6
30
s
Program/Erase Cycles (per Block)
100,000
cycles
Data Retention
20
years
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