参数资料
型号: MA31750
厂商: Dynex Semiconductor Ltd.
英文描述: High Performance MIL-STD-1750 Microprocessor
中文描述: 高性能的MIL - STD - 1750微处理器
文件页数: 41/42页
文件大小: 436K
代理商: MA31750
MA31750
41/42
12. RADIATION TOLERANCE
Total Dose Radiation Testing
For product procured to total dose radiation levels, each
wafer lot will be approved when all sample devices pass the
total dose radiation test.
The sample devices will be subjected to the total dose
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
Dynex Semiconductor can provide radiation testing
compliant with MIL STD 883 test method 1019, Ionizing
Radiation (Total Dose).
Total Dose (Function to specification)*
3x10
5
Rad(Si)
Transient Upset (Stored data loss)
5x10
10
Rad(Si)/sec
Transient Upset (Survivability)
>1x10
12
Rad(Si)/sec
Neutron Hardness (Function to specification)
>1x10
15
n/cm
2
Single Event Upset**
1x10
-11
Errors/bit day
Latch Up
Not possible
* Other total dose radiation levels available on request
** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Figure 42: Radiation Hardness Parameters
13. RELATED DOCUMENTATION
A number of Applications Notes are available to support
the information in this data sheets. Please call for details:
Application Note
Describes
No. 2
1750B Mode
No. 3
Use of Console Mode
No. 4
Use of Interrupts
No. 8
Use of VIO Instructions
No. 11
Bus Arbitration
No. 14
Use of NMA31750 Samples
No. 15
Pipelining Instructions
相关PDF资料
PDF描述
MA31751 Memory Management & Block Protection Unit
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MA31755 16-Bit Feedthrough Error Detection & Correction Unit EDAC
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