参数资料
型号: MTW32N20EG
厂商: ON Semiconductor
文件页数: 5/7页
文件大小: 0K
描述: MOSFET N-CH 200V 32A TO247
产品变化通告: 1Q2012 Discontinuation 30/Mar/2012
产品目录绘图: MOSFET TO-247AE
标准包装: 30
FET 型: MOSFET N 通道,金属氧化物
FET 特点: 标准
漏极至源极电压(Vdss): 200V
电流 - 连续漏极(Id) @ 25° C: 32A
开态Rds(最大)@ Id, Vgs @ 25° C: 75 毫欧 @ 16A,10V
Id 时的 Vgs(th)(最大): 4V @ 250µA
闸电荷(Qg) @ Vgs: 120nC @ 10V
输入电容 (Ciss) @ Vds: 5000pF @ 25V
功率 - 最大: 180W
安装类型: 通孔
封装/外壳: TO-247-3
供应商设备封装: TO-247
包装: 管件
产品目录页面: 1558 (CN2011-ZH PDF)
其它名称: MTW32N20EGOS
MTW32N20E
20
16
V DS
T J = 25 ° C
I D = 32 A
V DS = 160 V
200
180
160
140
1000
200
100
T J = 25 ° C
I D = 32 A
V DD = 100 V
V GS = 10 V
t d(off)
t d(on)
t r
t f
12
Q T
120
100
8
Q 1
Q 2
V GS
80
60
20
10
4
40
0
0
10
Q 3
20
30 40 50 60 70
80
90
20
0
100
2
1
1
2
10
20
100
Q T , TOTAL CHARGE (nC)
Figure 8. Gate ? To ? Source and Drain ? To ? Source
Voltage versus Total Charge
R G , GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time
Variation versus Gate Resistance
DRAIN ? TO ? SOURCE DIODE CHARACTERISTICS
30
20
10
T J = 25 ° C
V GS = 0 V
0
0
0.2 0.4 0.6 0.8 1
V SD , SOURCE-TO-DRAIN VOLTAGE (VOLTS)
Figure 10. Diode Forward Voltage versus Current
SAFE OPERATING AREA
The Forward Biased Safe Operating Area curves define the
maximum simultaneous drain ? to ? source voltage and drain
current that a transistor can handle safely when it is forward
biased. Curves are based upon maximum peak junction
temperature and a case temperature (T C ) of 25 ° C. Peak
repetitive pulsed power limits are determined by using the
thermal response data in conjunction with the procedures
discussed in AN569, “Transient Thermal Resistance ? General
Data and Its Use.”
Switching between the off ? state and the on ? state may
traverse any load line provided neither rated peak current
(I DM ) nor rated voltage (V DSS ) is exceeded and the
transition time (t r ,t f ) do not exceed 10 m s. In addition the total
power averaged over a complete switching cycle must not
exceed (T J(MAX) ? T C )/(R q JC ).
A Power MOSFET designated E ? FET can be safely used
reliable operation, the stored energy from circuit inductance
dissipated in the transistor while in avalanche must be less
than the rated limit and adjusted for operating conditions
differing from those specified. Although industry practice is
to rate in terms of energy, avalanche energy capability is not
a constant. The energy rating decreases non ? linearly with an
increase of peak current in avalanche and peak junction
temperature.
Although many E ? FETs can withstand the stress of
drain ? to ? source avalanche at currents up to rated pulsed
current (I DM ), the energy rating is specified at rated
continuous current (I D ), in accordance with industry
custom. The energy rating must be derated for temperature
as shown in the accompanying graph (Figure 12). Maximum
energy at currents below rated continuous I D can safely be
assumed to equal the values indicated.
in switching circuits with unclamped inductive loads. For
http://onsemi.com
5
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