参数资料
型号: NOIV1SE025KA-GDC
厂商: ON Semiconductor
文件页数: 63/76页
文件大小: 0K
描述: IC IMAGE SENSOR 25MP 355PGA
标准包装: 14
系列: *
象素大小: 4.5µm x 4.5µm
有源象素阵列: 5120H x 5120V
每秒帧数: 53
类型: CMOS 成像
封装/外壳: *
供应商设备封装: *
包装: *
NOIV1SN025KA
Table 35. PIN DESCRIPTION
Pin No.
E23
E24
E25
F01
F02
F03
F04
F05
F06
F07
F08
F09
F10
F11
F12
F13
F14
F15
F16
F17
F18
F19
F20
F21
F22
F23
F24
F25
G01
G02
G03
G04
G05
G06
G07
G08
G09
G10
G11
G12
G13
G14
Name
trigger
sclk
reset_n
adc_dout3
adc_dout6
srd2_nguard
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
gnd_colbias
scan_in2
scan_in1
scan_in0
adc_dout8
adc_dout7
afe_clk
srd1_nguard
srd1_n
td_anode
td_cathode
mbs3_in
mbs4_in
spare_ana
spare_ana
spare_dig_in
spare_dig_in
spare_dig_in
Type
CMOS
CMOS
CMOS
CMOS
CMOS
Analog
Ground
Ground
Ground
Ground
Ground
Ground
Ground
Ground
Ground
Ground
Ground
Ground
Ground
Ground
Ground
Ground
Ground
Ground
Ground
CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
Analog
Analog
Analog
Analog
Analog
Analog
Analog
Analog
CMOS
CMOS
CMOS
Direction
In
In
In
Out
Out
In
In
In
Out
Out
Out
In/Out
In/Out
In
In
Out
Out
In
In
In
Description
Trigger
SPI clock
Active low system reset
For test purposes only. Do not connect
For test purposes only. Do not connect
Not connected
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Column biasing ground - Connect to ground
Scan chain input #2 - Connect to ground
Scan chain input #1 - Connect to ground
Scan chain input #0 - Connect to ground
For test purposes only. Do not connect
For test purposes only. Do not connect
For test purposes only. Do not connect
Not connected
Not connected
Temperature diode - Anode
Temperature diode - Cathode
Analog test input - Connect to ground
Analog test input - Connect to ground
For test purposes only. Do not connect
For test purposes only. Do not connect
Digital test input - Connect to ground
Digital test input - Connect to ground
Digital test input - Connect to ground
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