参数资料
型号: NT5SV8M8DT-7
厂商: NANYA TECHNOLOGY CORP
元件分类: DRAM
英文描述: 8M X 8 SYNCHRONOUS DRAM, 5.4 ns, PDSO54
封装: 0.400 INCH, PLASTIC, TSOP2-54
文件页数: 1/21页
文件大小: 190K
代理商: NT5SV8M8DT-7
NT5SV16M4DT
NT5SV8M8DT
NT5SV4M16DT
64Mb Synchronous DRAM
REV 1.1
10/01
1
NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Features
High Performance:
Single Pulsed RAS Interface
Fully Synchronous to Positive Clock Edge
Four Banks controlled by BS0/BS1 (Bank Select)
Programmable CAS Latency: 2, 3
Programmable Burst Length: 1, 2, 4, 8, Full page
Programmable Wrap: Sequential or Interleave
Multiple Burst Read with Single Write Option
Automatic and Controlled Precharge Command
Data Mask for Read/Write control (x4, x8)
Dual Data Mask for byte control (x16)
Auto Refresh (CBR) and Self Refresh
Suspend Mode and Power Down Mode
Standard Power operation
4096 refresh cycles/64ms
Random Column Address every CK (1-N Rule)
Single 3.3V
??0.3V Power Supply
LVTTL compatible
Package:
54-pin 400 mil TSOP-Type II
Description
The NT5SV16M4DT, NT5SV8M8DT, and NT5SV4M16DT
are four-bank Synchronous DRAMs organized as 4Mbit x 4
I/O x 4 Bank, 2Mbit x 8 I/O x 4 Bank, and 1Mbit x 16 I/O x 4
Bank, respectively. These synchronous devices achieve
high-speed data transfer rates of up to 200MHz by employing
a pipeline chip architecture that synchronizes the output data
to a system clock. The chip is fabricated with NTC’s
advanced 64Mbit single transistor CMOS DRAM process
technology.
The device is designed to comply with all JEDEC standards
set for synchronous DRAM products, both electrically and
mechanically. All of the control, address, and data input/out-
put (I/O or DQ) circuits are synchronized with the positive
edge of an externally supplied clock.
RAS, CAS, WE, and CS are pulsed signals which are exam-
ined at the positive edge of each externally applied clock
(CK). Internal chip operating modes are defined by combina-
tions of these signals and a command decoder initiates the
necessary timings for each operation. A fourteen bit address
bus accepts address data in the conventional RAS/CAS mul-
tiplexing style. Twelve row addresses (A0-A11) and two bank
select addresses (BS0, BS1) are strobed with RAS. Eleven
column addresses (A0-A9) plus bank select addresses and
A10 are strobed with CAS. Column address A9 is dropped on
the x8 device, and column addresses A8 and A9 are dropped
on the x16 device.
Prior to any access operation, the CAS latency, burst length,
and burst sequence must be programmed into the device by
address inputs A0-A11, BS0, BS1 during a mode register set
cycle. In addition, it is possible to program a multiple burst
sequence with single write cycle for write through cache oper-
ation.
Operating the four memory banks in an interleave fashion
allows random access operation to occur at a higher rate
than is possible with standard DRAMs. A sequential and gap-
less data rate of up to 200MHz is possible depending on
burst length, CAS latency, and speed grade of the device.
Simultaneous operation of both decks of a stacked device is
allowed, depending on the operation being done. Auto
Refresh (CBR) and Self Refresh operation are supported.
-6K
-7K
-7
Units
fCK
Clock
Frequency
166
133
143
133
143
MHz
tCK Clock Cycle
6
7.5
7
7.5
7
ns
CL
CAS Latency
CL=3
CL=2
CL=3
CL=2
CL=3
CKs
tAC
Clock Access
Time1
---
---
ns
tAC
Clock Access
Time
2
5.4
ns
1. Terminated load. See AC Characteristics on page 16.
2. Unterminated load. See AC Characteristics on page 16.
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