参数资料
型号: OR3T306S240I-DB
厂商: LATTICE SEMICONDUCTOR CORP
元件分类: FPGA
英文描述: FPGA, 196 CLBS, 48000 GATES, PQFP240
封装: PLASTIC, SQFP-240
文件页数: 158/203页
文件大小: 1368K
代理商: OR3T306S240I-DB
第1页第2页第3页第4页第5页第6页第7页第8页第9页第10页第11页第12页第13页第14页第15页第16页第17页第18页第19页第20页第21页第22页第23页第24页第25页第26页第27页第28页第29页第30页第31页第32页第33页第34页第35页第36页第37页第38页第39页第40页第41页第42页第43页第44页第45页第46页第47页第48页第49页第50页第51页第52页第53页第54页第55页第56页第57页第58页第59页第60页第61页第62页第63页第64页第65页第66页第67页第68页第69页第70页第71页第72页第73页第74页第75页第76页第77页第78页第79页第80页第81页第82页第83页第84页第85页第86页第87页第88页第89页第90页第91页第92页第93页第94页第95页第96页第97页第98页第99页第100页第101页第102页第103页第104页第105页第106页第107页第108页第109页第110页第111页第112页第113页第114页第115页第116页第117页第118页第119页第120页第121页第122页第123页第124页第125页第126页第127页第128页第129页第130页第131页第132页第133页第134页第135页第136页第137页第138页第139页第140页第141页第142页第143页第144页第145页第146页第147页第148页第149页第150页第151页第152页第153页第154页第155页第156页第157页当前第158页第159页第160页第161页第162页第163页第164页第165页第166页第167页第168页第169页第170页第171页第172页第173页第174页第175页第176页第177页第178页第179页第180页第181页第182页第183页第184页第185页第186页第187页第188页第189页第190页第191页第192页第193页第194页第195页第196页第197页第198页第199页第200页第201页第202页第203页
58
Lattice Semiconductor
Data Sheet
November 2006
ORCA Series 3C and 3T FPGAs
Special Function Blocks (continued)
ORCA Boundary-Scan Circuitry
The
ORCA Series boundary-scan circuitry includes a
test access port controller (TAPC), instruction register
(IR), boundary-scan register (BSR), and bypass regis-
ter. It also includes circuitry to support the four pre-
dened instructions.
Figure 38 shows a functional diagram of the boundary-
scan circuitry that is implemented in the
ORCA Series.
The input pins’ (TMS, TCK, and TDI) locations vary
depending on the part, and the output pin is the dedi-
cated TDO/RD_DATA output pad. Test data in (TDI) is
the serial input data. Test mode select (TMS) controls
the boundary-scan test access port controller (TAPC).
Test clock (TCK) is the test clock on the board.
The BSR is a series connection of boundary-scan cells
(BSCs) around the periphery of the IC. Each I/O pad on
the FPGA, except for CCLK, DONE, and the boundary-
scan pins (TCK, TDI, TMS, and TDO), is included in the
BSR. The rst BSC in the BSR (connected to TDI) is
located in the rst PIC I/O pad on the left of the top side
of the FPGA (PTA PIC). The BSR proceeds clockwise
around the top, right, bottom, and left sides of the array.
The last BSC in the BSR (connected to TDO) is located
on the top of the left side of the array (PL1D).
The bypass instruction uses a single FF, which resyn-
chronizes test data that is not part of the current scan
operation. In a bypass instruction, test data received on
TDI is shifted out of the bypass register to TDO. Since
the BSR (which requires a two FF delay for each pad)
is bypassed, test throughput is increased when devices
that are not part of a test operation are bypassed.
The boundary-scan logic is enabled before and during
conguration. After conguration, a conguration
option determines whether or not boundary-scan logic
is used.
The 32-bit boundary-scan identication register con-
tains the manufacturer’s ID number, unique part num-
ber, and version (as described earlier). The
identication register is the default source for data on
TDO after RESET if the TAP controller selects the shift-
data-register (SHIFT-DR) instruction. If boundary scan
is not used, TMS, TDI, and TCK become user I/Os, and
TDO is 3-stated or used in the readback operation.
An optional USERCODE is available if the boundary-
scan PSR1 instruction is not used. The selection
between PSR1 and USERCODE is a conguration
option and can be performed in ispLEVER. The USER-
CODE is an 11-bit value that the user can set during
device conguration and can be written to and read
from the FPGA via the boundary-scan logic. The
USERCODE value replaces the manufacturer eld of
the boundary-scan ID code when the USERCODE
instruction is issued, allowing users to have congured
devices identied in a user-dened manner. The manu-
facturer ID eld remains available when the IDCODE
instruction is issued.
5-5768(F)
Figure 38.
ORCA Series Boundary-Scan Circuitry Functional Diagram
TAP
CONTROLLER
TMS
TCK
BOUNDARY-SCAN REGISTER
PSR2 REGISTER (PLCs)
BYPASS REGISTER
DATA
MUX
INSTRUCTION DECODER
INSTRUCTION REGISTER
M
U
X
RESET
CLOCK IR
SHIFT-IR
UPDATE-IR
PUR
TDO
SELECT
ENABLE
RESET
CLOCK DR
SHIFT-DR
UPDATE-DR
TDI
DATA REGISTERS
PSR1 REGISTER (PLCs)
CONFIGURATION REGISTER
(RAM_R, RAM_W)
PRGM
I/O BUFFERS
VDD
IDCODE REGISTER
Select
devices
have
been
discontinued.
See
Ordering
Information
section
for
product
status.
相关PDF资料
PDF描述
OR3T307S240-DB FPGA, 196 CLBS, 48000 GATES, PQFP240
OR3T556PS240-DB FPGA, 324 CLBS, 80000 GATES, PQFP240
OR3T806PS240-DB FPGA, 484 CLBS, 116000 GATES, PQFP240
OR3T807PS240-DB FPGA, 484 CLBS, 116000 GATES, PQFP240
OR3T55-4BA256I FPGA, 324 CLBS, 40000 GATES, 80 MHz, PBGA256
相关代理商/技术参数
参数描述
OR3T30-7BA256 制造商:AGERE 制造商全称:AGERE 功能描述:3C and 3T Field-Programmable Gate Arrays
OR3T307BA256-DB 功能描述:FPGA - 现场可编程门阵列 1568 LUT 221 I/O RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 栅极数量: 逻辑块数量:943 内嵌式块RAM - EBR:1956 kbit 输入/输出端数量:128 最大工作频率:800 MHz 工作电源电压:1.1 V 最大工作温度:+ 70 C 安装风格:SMD/SMT 封装 / 箱体:FBGA-256
OR3T30-7BA256I 制造商:AGERE 制造商全称:AGERE 功能描述:3C and 3T Field-Programmable Gate Arrays
OR3T30-7BA352 制造商:AGERE 制造商全称:AGERE 功能描述:3C and 3T Field-Programmable Gate Arrays
OR3T30-7BA352I 制造商:AGERE 制造商全称:AGERE 功能描述:3C and 3T Field-Programmable Gate Arrays