参数资料
型号: ST7PL35F2MCXXXRE
厂商: STMICROELECTRONICS
元件分类: 微控制器/微处理器
英文描述: 8-BIT, MROM, 8 MHz, MICROCONTROLLER, PDSO20
封装: 0.300 INCH, ROHS COMPLIANT, PLASTIC, SOP-20
文件页数: 58/168页
文件大小: 2955K
代理商: ST7PL35F2MCXXXRE
Obsolete
Product(s)
- Obsolete
ST7L34, ST7L35, ST7L38, ST7L39
150/168
10-BIT ADC CHARACTERISTICS (cont’d)
Table 30. ADC Accuracy with 3V
≤ V
DD ≤ 3.6V
Table 31. ADC Accuracy with 4.5V
≤ V
DD ≤ 5.5V
Notes:
1. Data based on characterization results over the whole temperature range, monitored in production.
2. ADC accuracy vs negative injection current: Injecting negative current on any of the analog input pins may reduce the
accuracy of the conversion being performed on another analog input.
The effect of negative injection current on robust pins is specified in section 13.11 on page 149.
Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 13.8 does not affect the ADC
accuracy.
3. Data based on characterization results, monitored in production to guarantee 99.73% within ± max value from -40°C
to +125°C (± 3
σ distribution limits).
Figure 101. ADC Accuracy Characteristics
Symbol
Parameter
Conditions
Typ
Max3)
Unit
|ET|
Total unadjusted error
fCPU = 4 MHz, fADC = 2 MHz
1)2)
1.9
3.1
LSB
|EO|
Offset error
0.3
1.2
|EG|
Gain error
0.3
1
|ED|
Differential linearity error
1.8
3
|EL|
Integral linearity error
1.7
2.8
Symbol
Parameter
Conditions
Typ
Max3)
Unit
|ET|
Total unadjusted error
fCPU = 8 MHz, fADC = 4 MHz
1)2)
2.0
3.4
LSB
|EO|
Offset error
0.4
1.7
|EG|
Gain error
0.4
1.5
|ED|
Differential linearity error
1.9
3.1
|EL|
Integral linearity error
1.8
2.9
EO
EG
1LSBIDEAL
1LSB
IDEAL
V
DD
V
SS
1024
--------------------------------
=
Vin (LSBIDEAL)
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) End point correlation line
ET = Total Unadjusted Error: maximum deviation
between the actual and the ideal transfer curves.
EO = Offset Error: deviation between the first actu-
al transition and the first ideal one.
EG = Gain Error: deviation between the last ideal
transition and the last actual one.
ED = Differential Linearity Error: maximum devia-
tion between actual steps and the ideal one.
EL = Integral Linearity Error: maximum deviation
between any actual transition and the end point
correlation line.
Digital Result ADCDR
1023
1022
1021
5
4
3
2
1
0
7
6
1
234567
1021 1022 1023 1024
(1)
(2)
ET
ED
EL
(3)
VDD
VSS
相关PDF资料
PDF描述
ST7PL35F2UA/XXXE 8-BIT, MROM, 8 MHz, MICROCONTROLLER, QCC20
ST7L35F2UA/XXXRE 8-BIT, MROM, 8 MHz, MICROCONTROLLER, QCC20
ST7L35F2UC/XXXRE 8-BIT, MROM, 8 MHz, MICROCONTROLLER, QCC20
ST7L39F2MC/XXXE 8-BIT, MROM, 8 MHz, MICROCONTROLLER, PDSO20
ST7L39F2UC/XXXRE 8-BIT, MROM, 8 MHz, MICROCONTROLLER, QCC20
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