参数资料
型号: SUM110N10-09-E3
厂商: Vishay Siliconix
文件页数: 2/8页
文件大小: 0K
描述: MOSFET N-CH 100V 110A D2PAK
产品目录绘图: SUB, SUM Series
标准包装: 1
系列: TrenchFET®
FET 型: MOSFET N 通道,金属氧化物
FET 特点: 标准
漏极至源极电压(Vdss): 100V
电流 - 连续漏极(Id) @ 25° C: 110A
开态Rds(最大)@ Id, Vgs @ 25° C: 9.5 毫欧 @ 30A,10V
Id 时的 Vgs(th)(最大): 4V @ 250µA
闸电荷(Qg) @ Vgs: 160nC @ 10V
输入电容 (Ciss) @ Vds: 6700pF @ 25V
功率 - 最大: 3.75W
安装类型: 表面贴装
封装/外壳: TO-263-3,D²Pak(2 引线+接片),TO-263AB
供应商设备封装: TO-263(D2Pak)
包装: 标准包装
其它名称: SUM110N10-09-E3DKR
SUM110N10-09
Vishay Siliconix
SPECIFICATIONS T J = 25 °C, unless otherwise noted
Parameter
Symbol
Test Conditions
Min.
Typ.
Max.
Unit
Static
Drain-Source Breakdown Voltage
Gate-Threshold Voltage
Gate-Body Leakage
V DS
V GS(th)
I GSS
V DS = 0 V, I D = 250 μA
V DS = V GS , I D = 250 μA
V DS = 0 V, V GS = ± 20 V
100
2
4
± 100
V
nA
V DS = 100 V, V GS = 0 V
1
Zero Gate Voltage Drain Current
I DSS
V DS = 100 V, V GS = 0 V, T J = 125 °C
50
μA
V DS = 100 V, V GS = 0 V, T J = 175 °C
250
On-State Drain Current a
I D(on)
V DS ≥ 5 V, V GS = 10 V
V GS = 10 V, I D = 30 A
120
0.0078
0.0095
A
Drain-Source On-State Resistance a
R DS(on)
V GS = 10 V, I D = 30 A, T J = 125 °C
0.017
Ω
V GS = 10 V, I D = 30 A, T J = 175 °C
0.025
Forward Transconductance a
g fs
V DS = 15 V, I D = 30 A
25
S
Dynamic b
Input Capacitance
C iss
6700
Gate-Source Charge
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge c
c
Gate-Drain Charge c
C oss
C rss
Q g
Q gs
Q gd
V GS = 0 V, V DS = 25 V, f = 1 MHz
V DS = 50 V, V GS = 10 V, I D = 85 A
750
280
110
24
24
160
pF
nC
Gate Resistance
R g
1.0
6.2
Ω
Turn-On Delay Time
c
t d(on)
20
30
Rise Time c
Turn-Off Delay Time c
Fall Time c
t r
t d(off)
t f
V DD = 50 V, R L = 0.6 Ω
I D ? 85 A, V GEN = 10 V, R g = 2.5 Ω
125
55
130
200
85
195
ns
Source-Drain Diode Ratin g s and Characteristics T C = 25
°C b
Continuous Current
Pulsed Current
I S
I SM
110
240
A
Forward Voltage a
Reverse Recovery Time
Peak Reverse Recovery Charge
Reverse Recovery Charge
V SD
t rr
I RM(REC)
Q rr
I F = 85 A, V GS = 0 V
I F = 50 A, dI/dt = 100 A/μs
1.0
70
5.5
0.19
1.5
140
10
0.35
V
ns
A
μC
Notes:
a. Pulse test; pulse width ≤ 300 μs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
c. Independent of operating temperature.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
www.vishay.com
2
Document Number: 70677
S10-0644-Rev. G, 22-Mar-10
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