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| 型号： | AD9627ABCPZ-80 |
| 厂商： | Analog Devices Inc |
| 文件页数： | 33/76页 |
| 文件大小： | 0K |
| 描述： | IC ADC 12BIT 80MSPS 64LFCSP |
| 标准包装： | 1 |
| 位数： | 12 |
| 采样率（每秒）： | 80M |
| 数据接口： | 串行，SPI? |
| 转换器数目： | 2 |
| 功率耗散（最大）： | 490mW |
| 电压电源： | 模拟和数字 |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 64-VFQFN 裸露焊盘，CSP |
| 供应商设备封装： | 64-LFCSP-VQ（9x9） |
| 包装： | 托盘 |
| 输入数目和类型： | 4 个单端，单极；2 个差分，单极 |
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AD9627
Rev. B | Page 39 of 76
BUILT-IN SELF-TEST (BIST) AND OUTPUT TEST
The AD9627 includes built-in test features designed to enable
verification of the integrity of each channel as well as facilitate
board level debugging. A BIST (built-in self-test) feature is included
that verifies the integrity of the digital datapath of the AD9627.
Various output test options are also provided to place predictable
values on the outputs of the AD9627.
BUILT-IN SELF-TEST (BIST)
The BIST is a thorough test of the digital portion of the selected
AD9627 signal path. When enabled, the test runs from an internal
pseudorandom noise (PN) source through the digital datapath
starting at the ADC block output. The BIST sequence runs for
512 cycles and stops. The BIST signature value for Channel A or
Channel B is placed in Register 0x24 and Register 0x25. If one
channel is chosen, its BIST signature is written to the two registers.
If both channels are chosen, the results from Channel A are placed
in the BIST signature registers.
The outputs are not disconnected during this test, so the PN
sequence can be observed as it runs. The PN sequence can be
continued from its last value or reset from the beginning, based
on the value programmed in Register 0x0E, Bit 2. The BIST
signature result varies based on the channel configuration.
OUTPUT TEST MODES
The output test options are shown in Table 25. When an output
test mode is enabled, the analog section of the ADC is discon-
nected from the digital back end blocks and the test pattern is run
through the output formatting block. Some of the test patterns are
subject to output formatting, and some are not. The seed value for
the PN sequence tests can be forced if the PN reset bits are used
to hold the generator in reset mode by setting Bit 4 or Bit 5 of
Register 0x0D. These tests can be performed with or without
an analog signal (if present, the analog signal is ignored), but
they do require an encode clock. For more information, see
Application Note AN-877, Interfacing to High Speed ADCs via SPI.
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相关代理商/技术参数 |
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| AD9627BCPZ-105 | 制造商:Analog Devices 功能描述:ADC Dual Pipelined 105Msps 12-bit Parallel/LVDS 64-Pin LFCSP EP |
| AD9627BCPZ11-105 | 制造商:Analog Devices 功能描述: 制造商:Rochester Electronics LLC 功能描述: |
| AD9627BCPZ11-150 | 制造商:Analog Devices 功能描述: 制造商:Rochester Electronics LLC 功能描述: |
| AD9627BCPZ-125 | 制造商:Analog Devices 功能描述: 制造商:Rochester Electronics LLC 功能描述: |
| AD9627BCPZ-150 | 制造商:Analog Devices 功能描述:ADC Dual Pipelined 150Msps 12-bit Parallel/LVDS 64-Pin LFCSP EP 制造商:Analog Devices 功能描述:ADC Dual Pipelined 150Msps 12-bit Parallel/LVDS 64-Pin LFCSP EP Tray |
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