参数资料
| 型号： | ADATE207BBPZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 1/36页 |
| 文件大小： | 0K |
| 描述： | IC TIMING FORMATTER QUAD 256BGA |
| 标准包装： | 1 |
| 类型： | 四针定时格式器 |
| PLL： | 是 |
| 主要目的： | 自动测试设备 |
| 电路数： | 4 |
| 频率 - 最大： | 100MHz |
| 电源电压： | 2.375 V ~ 2.625 V |
| 工作温度： | -25°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 256-LBGA 裸露焊盘 |
| 供应商设备封装： | 256-BGA（27x27） |
| 包装： | 托盘 |
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Quad Pin Timing Formatter
ADATE207
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibilityis assumedbyAnalogDevicesforitsuse,norforanyinfringements of patents or other
rightsofthirdpartiesthatmayresultfromitsuse.Specificationssubjecttochangewithoutnotice.No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarksandregisteredtrademarksarethepropertyoftheirrespectiveowners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
Fax: 781.461.3113
2007 Analog Devices, Inc. All rights reserved.
FEATURES
4-channel timing formatter
256 waveforms per channel
4 independent event edges per waveform
STIL IEEE 1450-1999-compatible events
4-period range for each edge
39.06 ps timing resolution
2.5 ns minimum edge refire rate
All drive formats supported
100 MHz base vector rate
×2 and ×4 high speed modes
×2 pin multiplexing
1 ns minimum pulse width
32-bit fail counter per channel
4-bit pin capture per channel
Air cooled, low power CMOS design
6 W at 100 MHz base rate
2.5 V power supply
Differential DCL interface control
TMU multiplexer
APPLICATIONS
Automatic test equipment (ATE)
High speed digital instrumentation
Pulse generation
FUNCTIONAL BLOCK DIAGRAM
TIME SET
MEMORY
FORMAT
COMPARE
LOGIC
QUAD EDGE
GENERATOR
FAIL
DETECTION
PATTERN
FAIL
DCL
INTERFACE
TIME SET
MEMORY
FORMAT
COMPARE
LOGIC
QUAD EDGE
GENERATOR
FAIL
DETECTION
PATTERN
FAIL
DCL
INTERFACE
TIME SET
MEMORY
FORMAT
COMPARE
LOGIC
QUAD EDGE
GENERATOR
FAIL
DETECTION
PATTERN
FAIL
DCL
INTERFACE
TIME SET
MEMORY
FORMAT
COMPARE
LOGIC
QUAD EDGE
GENERATOR
FAIL
DETECTION
PATTERN
FAIL
DCL
INTERFACE
ADATE207
05
55
7-
0
01
Figure 1.
GENERAL DESCRIPTION
The ADATE207 is a timing generator and formatter for auto-
matic test equipment (ATE) equipment. The ADATE207 provides
four independent channels with a 100 MHz base vector rate of
timing and formatting for ATE digital pins. It interfaces between
the pattern memory,and the driver, comparator, and load (DCL)
chips for complete digital pins. The ADATE207 accepts up to
eight bits of pattern data per pin and can produce formatted
outputs and perform comparisons of DUT expected responses.
Each channel of the ADATE207 provides 256 selectable wave-
forms, wherein each waveform consists of up to four possible
events. Each event consists of a programmable timing edge and a
STIL-compatible (IEEE Standard 1450-1999) set.
Each timing edge generator can produce an edge with a span of
four periods with a 39.06 ps edge placement resolution. The delay
generators use a reference master clock of 100 MHz and provide
programmable delays based upon counts of the clock and a
compensated CMOS analog timing vernier. The programmable
delay generators can be additionally delayed by a global 8-bit
input value that is shared across all edges.
The format and compare logic support ×2 pin multiplexing to
allow the trading of pin count for speed.
Each channel provides a 4-bit DUT output capture supporting
mixed signal receive memory applications. The fail detection
logic includes a 32-bit fail accumulation register per channel.
An external TMU is supported with three 8-to-1 multiplexers.
This allows the dual comparator outputs of any pin to be
multiplexed to any of the three outputs: arm, start, or stop
signals.
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